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EEMCS EPrints Service


Supervisor: Mouthaan, A.J.
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Number of items: 2.

2004

Nguyen, Van Hieu (2004) Multilevel interconnect reliability on the effects of electro-thermomechanical stresses. PhD thesis, University of Twente. ISBN 90-365-2029-0
Merticaru, A.R. (2004) Electrical instability of a-Si:H/SiN thin film transistors : a study at room temperature and low voltage stress. PhD thesis, University of Twente. ISBN 90-365-2056-8

This list was generated on Fri Mar 24 09:28:58 CET 2017.