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Number of items: 2. 2004
Nguyen, Van Hieu
(2004)
Multilevel interconnect reliability on the effects of electro-thermomechanical stresses.
PhD thesis, University of Twente.
ISBN 90-365-2029-0
Merticaru, A.R.
(2004)
Electrical instability of a-Si:H/SiN thin film transistors : a study at room temperature and low voltage stress.
PhD thesis, University of Twente.
ISBN 90-365-2056-8
This list was generated on Thu May 24 09:02:28 CEST 2012. |
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