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EEMCS EPrints Service


Supervisor: Kuper, F.G.
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Number of items: 8.

2008

Sasse, G.T. (2008) Reliability engineering in RF CMOS. PhD thesis, University of Twente. ISBN 978-90-365-2690-6

2007

Nicollian, P.E. (2007) Physics of Trap Generation and Electrical Breakdown in Ultra-thin SiO2 and SiON Gate Dielectric Materials PhD thesis, University of Twente. ISBN 978-90-365-2563-3

2005

Sowariraj, M.S.B. (2005) Full chip modelling of ICs under CDM stress. PhD thesis, University of Twente. ISBN 90-365-2217-X

2004

Wang, Zhichun (2004) Detection of and protection against plasma charging damage in modern IC Technology. PhD thesis, University of Twente. ISBN 90-365-2079-7
Ackaert, J.G.G. (2004) Dielectric engineering: Characterization, development and process damage minimization of various silicon oxides. PhD thesis, University of Twente. ISBN 90-365-2069-X
Nguyen, Van Hieu (2004) Multilevel interconnect reliability on the effects of electro-thermomechanical stresses. PhD thesis, University of Twente. ISBN 90-365-2029-0
Merticaru, A.R. (2004) Electrical instability of a-Si:H/SiN thin film transistors : a study at room temperature and low voltage stress. PhD thesis, University of Twente. ISBN 90-365-2056-8

2002

Golo-Tosic, N. (2002) Electrostatic discharge effects in thin film transistors. PhD thesis, University of Twente. ISBN 9036518091

This list was generated on Mon May 22 07:31:00 CEST 2017.