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Number of items: 8. 2008
Sasse, G.T.
(2008)
Reliability engineering in RF CMOS.
PhD thesis, University of Twente.
ISBN 978-90-365-2690-6
2007
Nicollian, P.E.
(2007)
Physics of Trap Generation and Electrical Breakdown in Ultra-thin SiO2 and SiON Gate Dielectric Materials
PhD thesis, University of Twente.
ISBN 978-90-365-2563-3
2005
Sowariraj, M.S.B.
(2005)
Full chip modelling of ICs under CDM stress.
PhD thesis, University of Twente.
ISBN 90-365-2217-X
2004
Wang, Zhichun
(2004)
Detection of and protection against plasma charging damage in modern IC Technology.
PhD thesis, University of Twente.
ISBN 90-365-2079-7
Ackaert, J.G.G.
(2004)
Dielectric engineering: Characterization, development and process damage minimization of various silicon oxides.
PhD thesis, University of Twente.
ISBN 90-365-2069-X
Nguyen, Van Hieu
(2004)
Multilevel interconnect reliability on the effects of electro-thermomechanical stresses.
PhD thesis, University of Twente.
ISBN 90-365-2029-0
Merticaru, A.R.
(2004)
Electrical instability of a-Si:H/SiN thin film transistors : a study at room temperature and low voltage stress.
PhD thesis, University of Twente.
ISBN 90-365-2056-8
2002
Golo-Tosic, N.
(2002)
Electrostatic discharge effects in thin film transistors.
PhD thesis, University of Twente.
ISBN 9036518091
This list was generated on Thu May 24 09:00:20 CEST 2012. |
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