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Research Project: Tunable Components
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2010

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Mauczock, R. and Keur, W. and Hueting, R.J.E. (2010) BaxSr1-xTi1.02O3 metal-insulator-metal capacitors on planarized alumina substrates Thin solid films, 518 (10). pp. 2854-2959. ISSN 0040-6090 *** ISI Impact 1,761 ***

2009

Furukawa, Y. and Reimann, K. and Jedema, F. and Tiggelman, M.P.J. and Roest, A.L. (2009) Tunable capacitor. Patent EP20090742493 (Application).
Tiggelman, M.P.J. (2009) Thin film barium strontium titanate capacitors for tunable RF front-end applications. PhD thesis, University of Twente. ISBN 978-90-365-2937-2
Tiggelman, M.P.J. and Reimann, K. (2009) Reconfigurable radio-frequency front-end. Patent EP20090786833 (Application).
Tiggelman, M.P.J. and Reimann, K. and Van Rijs, F. and Schmitz, J. and Hueting, R.J.E. (2009) On the trade-off between quality factor and tuning ratio in tunable high-frequency capacitors. IEEE transactions on electron devices, 56 (9). pp. 2128-2136. ISSN 0018-9383 *** ISI Impact 2,207 ***

2008

Klee, M. and Keur, W. and Mauczock, R. and van Esch, H. and de Wild, M. and Liu, J. and Roest, A.L. and Reimann, K. and Renders, C. and Peters, L. and Tiggelman, M.P.J. and Wunnicke, O. and Neumann, K. (2008) MI004 miniaturised, high performance ferroelectric and piezoelectric thin film devices. In: 17th IEEE International Symposium on the Applications of Ferroelectrics, 2008. ISAF 2008, 23-28 feb 2008, Santa Re, NM, USA. pp. 1-4. IEEE Computer Society. ISSN 1099-4734 ISBN 978-1-4244-2744-4
Tiggelman, M.P.J. and Reimann, K. and Liu, J. and Klee, M. and Keur, W. and Mauczock, R. and Schmitz, J. and Hueting, R.J.E. (2008) Identifying dielectric and resistive electrode losses in high-density capacitors at radio frequencies. In: Proceedings of the 21st ICMTS 2008 IEEE Conference on Microelectronic Test Structures, 24-27 Mar 2008, Edinburgh, Schotland. pp. 190-195. IEEE Computer Society. ISBN 978-1-4244-1801-5
Tiggelman, M.P.J. and Reimann, K. and Liu, J. and Klee, M. and Mauczock, R. and Keur, W. and Schmitz, J. and Hueting, R.J.E. (2008) The trade-off between tuning ratio and quality factor of BaxSr1-xTiO3 MIM capacitors on alumina substrates In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands. pp. 506-508. Technology Foundation STW. ISBN 978-90-73461-56-7

2007

Klee, M. and Beelen, D. and Keurl, W. and Kiewitt, R. and Kumar, B. and Mauczock, R. and Reimann, K. and Renders, C. and Roest, A.L. and Roozeboom, F. and Steeneken, P.G. and Tiggelman, M.P.J. and Vanhelmont, F. and Wunnicke, O. and Lok, P. and Neumann, K. and Fraser, J. and Schmitz, G. (2007) Application of Dielectric, Ferroelectric and Piezoelectric Thin Film Devices in Mobile Communication and Medical Systems. (Invited) In: 15th ieee international symposium on the Applications of ferroelectrics, 2006. isaf '06, 30 Jul - 03 Aug 2006, Sunset Beach, NC, USA. pp. 9-16. IEEE Computer Society. ISSN 1099-4734 ISBN 978-1-4244-1332-4
Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Schmitz, J. and Hueting, R.J.E. and Liu, J. and Furukawa, Y. and Mauczock, R. and Keur, W. (2007) Separation of intrinsic dielectric and resistive electrode losses in ferroelectric capacitors at radio frequencies. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands. pp. 465-467. Technology Foundation STW. ISBN 978-90-73461-49-9
Tiggelman, M.P.J. and Reimann, K. and Schmitz, J. (2007) Reducing AC impedance measurement errors caused by the DC voltage dependence of broadband high-voltage bias-tees. In: Proceeding of 2007 IEEE International Conference on Microelectronic Test Structures,, 19-22 March 2007, Tokyo, Japan.. pp. 200-205. IEEE Computer Society. ISBN 1-4244-0781-8

2006

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Beelen, D. and Keur, W. and Schmitz, J. and Hueting, R.J.E. (2006) Electrical characterization of thin film ferroelectric capacitors. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands. pp. 439-443. Technology Foundation STW. ISBN 90-73461-44-8