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2014

Khan, M.A. (2014) On improving dependability of analog and mixed-signal SoCs: A system-level approach. PhD thesis, University of Twente. CTIT Ph.D.-thesis series No. 14-328 ISBN 978-90-365-3777-3
Rohani, A. (2014) Modelling and mitigation of soft-errors in CMOS processors. PhD thesis, univ. of Twente. CTIT Ph.D.-thesis series No. 15-346 ISBN 9789036538077
Wan, Jinbo and Kerkhoff, H.G. (2014) The influence of no fault found in analogue CMOS circuits. In: 2014 International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW'14), 17-19 Sep 2014, Porto Alegre, Brazil. pp. 1-6. IEEE Computer Society. ISBN 978-1-47996-540-3

2013

Khan, M.A. and Kerkhoff, H.G. (2013) Monitoring operating temperature and supply voltage in achieving high system dependability. In: 8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 Mar 2013, Abu Dhabi, UAE. pp. 108-112. IEEE. ISBN 978-1-4673-6039-5
Rohani, A. and Kerkhoff, H.G. (2013) Rapid Transient Fault Insertion in Large Digital Systems. Microprocessors and microsystems, 37 (2). pp. 147-154. ISSN 0141-9331 *** ISI Impact 0,471 ***
Rohani, A. and Kerkhoff, H.G. and Costenaro, E. and Alexandrescu, D. (2013) Pulse-length determination techniques in the rectangular single event transient fault model. In: International Conference on Embedded Computer Systems: architectures, modeling, and simulation, SAMOS XIII, 15-18 Jul 2013, Samos, Greece. pp. 213-218. IEEE Computer Society. ISBN 978-1-4799-0103-6

2012

Kerkhoff, H.G. and Wan, Jinbo and Zhao, Yong (2012) Hierarchical modeling of automotive sensor front-ends for structural diagnosis of aging faults. In: 18th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2012, 14-16 May 2012, Taipei, Taiwan, China. pp. 91-96. IEEE Computer Society. ISBN 978-1-4673-1925-6
Rohani, A. and Kerkhoff, H.G. (2012) An online soft error mitigation technique for control logic of VLIW processors. In: Proceedings of IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 3-5 Oct 2012, Austin, TX, USA. pp. 85-91. IEEE Computer Society. ISBN 978-1-4673-3042-8
Wan, Jinbo and Kerkhoff, H.G. (2012) Monitoring active filters under automotive aging scenarios with embedded instrument. In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, 12-16 Mar 2012, Dresden, Germany. pp. 1096-1101. Electronic Design Automation Publishing Association. ISSN 1530-1591 ISBN 978-1-4577-2145-8

2011

Kerkhoff, H.G. (2011) New View Requirements for Analogue/MS IPs for Dependability Optimization in Heterogeneous SoC Design. In: 17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011, 16-18 May 2011, Santa Barbara, USA. pp. 5-11. IEEE Computer Society. ISBN 978-0-7695-4479-3
Kerzerho, V.A. and Kerkhoff, H.G. and Bollen, G-J and Xing, Y (2011) The Search for Resilience Weak Spots in Automotive Mixed-Signal Circuits. In: Proceedings 17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011, 16-18 May 2011, Santa Barbara, USA. pp. 12-18. IEEE Computer Society. ISSN 0168-275X ISBN 978-0-7695-4479-3
Khan, M.A. and Kerkhoff, H.G. (2011) A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. In: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011, 13-15 April 2011, Cottbus, Germany. pp. 17-22. IEEE . ISBN 978-1-4244-9753-9
Khan, M.A. and Kerkhoff, H.G. (2011) SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life. In: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 3-5 Oct 2011, Vancouver, B.C. Canada. pp. 374-381. IEEE Computer Society. ISSN 1550-5774 ISBN 978-0-7695-4556-1
Krishnan, S. and Kerkhoff, H.G. (2011) A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. In: Proceedings 16th IEEE European Test Symposium, ETS 2011, 23 May - 27 May 2011, Trondheim, Norway. pp. 159-164. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4577-0483-3
Rohani, A. and Kerkhoff, H.G. (2011) Study of the effects of SET induced faults on submicron technologies. In: 41st IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN-W 2011, 27-30 June 2011, Hong Kong. pp. 41-46. IEEE Computer Society. ISBN 978-1-4577-0374-4
Rohani, A. and Kerkhoff, H.G. (2011) A Technique for Accelerating Injection of Transient Faults in Complex SoCs. In: 14th Euromicro Conference on Digital System Design, DSD 2011, 31 Aug-02 Dec 2011, Oulu, Finland. pp. 213-220. IEEE Computer Society. ISBN 978-1-4577-1048-3
Wan, Jinbo and Kerkhoff, H.G. (2011) Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs. In: 2011 International SoC Design Conference, ISOCC 2011, 17-18 Nov 2011, Jeju, Korea. pp. 294-297. IEEE Circuits & Systems Society. ISBN 978-1-4577-0711-7

2010

Kerkhoff, H.G. and Wan, Jinbo (2010) Dependable Digitally-Assisted Mixed-Signal IPs Based on Integrated Self-Test & Self-Calibration. In: IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2010), 7-9 June 2010, La Grande Motte, France. pp. 1-6. IEEE Computer Society. ISBN 978-1-4244-7792-0
Wiggers, M.H. and Thiele, L. and Lee, Edward A. and Schlieker, S. and Bekooij, M.J.G. (2010) Modeling and Analyzing Real-Time Multiprocessor Systems. In: Proceedings of the Eighth IEEE/ACM/IFIP International Conference on Hardware/software Codesign and System synthesis, CODES/ISSS 2010, 24-29 oct 2010, Scottsdale, Arizona, USA. pp. 329-330. ACM. ISBN 978-1-60558-905-3

2009

Kerkhoff, H.G. (2009) Dependable reconfigurable multi-sensor poles for security. In: 15th International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW 2009), 10-12 Jun 2009, Scottsdale, AZ, USA. pp. 1-6. IEEE Computer Society. ISBN 978-1-4244-4618-6