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Research Project: Silicene Nanoelectronics
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2016

Wiggers, F.B. and Van Hao, B. and Friedlein, R. and Yamada-Takamura, Y. and Schmitz, J. and Kovalgin, A.Y. and de Jong, M.P. (2016) A nitride-based epitaxial surface layer formed by ammonia treatment of silicene-terminated ZrB2 Journal of chemical physics, 144 (134703). pp. 1-5. ISSN 0021-9606 *** ISI Impact 2,894 ***

2015

Van Hao, B. and Wiggers, F.B. and Friedlein, R. and Yamada-Takamura, Y. and Kovalgin, A.Y. and de Jong, M.P. (2015) On the feasibility of silicene encapsulation by AlN deposited using an atomic layer deposition process. Journal of chemical physics, 142. 064712. ISSN 0021-9606 *** ISI Impact 2,894 ***
Van Hao, B. and Wiggers, F.B. and Gupta, Anubha and Nguyen, Minh Duc and Aarnink, A.A.I. and de Jong, M.P. and Kovalgin, A.Y. (2015) Initial growth, refractive index, and crystallinity of thermal and plasma-enhanced atomic layer deposition AlN films. Journal of vacuum science and technology A: vacuum, surfaces, and films, 33. 01A111. ISSN 0734-2101 *** ISI Impact 1,724 ***

2014

Friedlein, R. and Fleurence, A. and Aoyagi, K. and de Jong, M.P. and Van Hao, B. and Wiggers, F.B. and Yoshimoto, S. and Koitaya, T. and Shimizu, S. and Noritake, H. and Mukai, K. and Yoshinobu, J. and Yamada-Takamura, Y. (2014) Core level excitations — A fingerprint of structural and electronic properties of epitaxial silicene. The journal of Chemical Physics, 140 (18). pp. 1-6. ISSN 0021-9606 *** ISI Impact 2,894 ***
Friedlein, R. and Van Hao, B. and Wiggers, F.B. and Yamada-Takamura, Y. and Kovalgin, A.Y. and de Jong, M.P. (2014) Interaction of epitaxial silicene with overlayers formed by exposure to Al atoms and O2 molecules Journal of chemical physics, 140. 204705:1-204705:4. ISSN 0021-9606 *** ISI Impact 2,894 ***
Van Hao, B. and Nguyen, Minh Duc and Wiggers, F.B. and Aarnink, A.A.I. and de Jong, M.P. and Kovalgin, A.Y. (2014) Self-limiting growth and thickness- and temperature-dependence of optical constants of ALD AlN thin films. ECS journal of solid state science and technology, 3 (4). pp. 101-106. ISSN 2162-8769 *** ISI Impact 1,650 ***
Van Hao, B. and Wiggers, F.B. and de Jong, M.P. and Kovalgin, A.Y. (2014) An approach to characterize ultra-thin conducting films protected against native oxidation by an in-situ capping layer. In: International Conference on Microelectronic Test Structures, ICMTS 2014, 24-27 March 2014, Udine, Italy. pp. 53-57. IEEE Circuits & Systems Society. ISSN 1071-9032 ISBN 978-1-4799-2193-5

2013

Van Hao, B. and Kovalgin, A.Y. and Aarnink, A.A.I. and de Jong, M.P. (2013) In situ spectroscopic ellipsometry for studying the growth and optical constants of ALD AlN films. NEVAC Blad, 51 (3). pp. 24-31. ISSN 0169-9431