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Research Project: Reliable RF: Robust RF Power-Drivers in low-voltage CMOS technology
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2011

Acar, M. (2011) Power Amplifiers in CMOS Technology: A contribution to power amplifier theory and techniques. PhD thesis, University of Twente. CTIT Ph.D.-thesis Series No. 10-187 ISBN 978-90-365-3138-2

2010

Acar, M. and Leenaerts, D.M.W. and Nauta, B. (2010) Frequency divider. Patent US7,671,641 B1 (Assigned).
Acar, M. and Leenaerts, D.M.W. and Nauta, B. (2010) Frequency divider. Patent US7737738 B2 (Assigned).

2008

Acar, M. and Annema, A.-J. and Nauta, B. (2008) Digital Detection of Oxide Breakdown and Life-Time Extension in Submicron CMOS Technology. In: Proceedings of the 2008 IEEE International Solid- State Circuits Conference (ISSCC2008), 8-12 Feb 2008, San Francisco. pp. 530-531. Digest of Technical Papers IEEE ISSCC 2008. IEEE Press. ISBN 978-1-4244-2011-7
Sasse, G.T. (2008) Reliability engineering in RF CMOS. PhD thesis, University of Twente. ISBN 978-90-365-2690-6
Sasse, G.T. and Acar, M. and Kuper, F.G. and Schmitz, J. (2008) RF CMOS reliability simulations. Microelectronics reliability, 48 (8-9). pp. 1581-1585. ISSN 0026-2714 *** ISI Impact 1,202 ***
Sasse, G.T. and Kuper, F.G. and Schmitz, J. (2008) MOSFET Degradation Under RF Stress. IEEE transactions on electron devices, 55 (11). pp. 3167-3174. ISSN 0018-9383 *** ISI Impact 2,207 ***
Sasse, G.T. and Schmitz, J. (2008) Application and evaluation of the RF charge-pumping technique. IEEE transactions on electron devices, 55 (3). pp. 881-889. ISSN 0018-9383 *** ISI Impact 2,207 ***

2007

Acar, M. and Annema, A.-J. and Nauta, B. (2007) Variable-Voltage Class-E Power Amplifiers. In: The IEEE MTT-S International Microwave Symposium 2007 (IMS 2007), 03-08-June 2007, Hawaii, Honolulu. pp. 1095-1098. 2007 IEEE MTT-S International Microwave Symposium Digest, (IMS 2007. IEEE Press. ISSN 0149-645X ISBN 1-4244-0688-9
Acar, M. and Annema, A.-J. and Nauta, B. (2007) Analytical Design Equations for Class-E Power Amplifiers. IEEE transactions on circuits and systems I: regular papers, 54 (12). pp. 2706-2717. ISSN 1549-8328 *** ISI Impact 2,393 ***
Acar, M. and Annema, A.-J. and Nauta, B. (2007) Analytical design equations for Class-E power amplifiers with finite DC-Feed inductance and switch on-resistance. In: The IEEE International Symposium on Circuits and Systems (ISCAS)-2007., 27-30 May 2007, New Orleans. pp. 2818-2821. IEEE Press. ISBN 1-4244-0921-7
Bouwmeester, E. (2007) Continuous Classes of Power Amplifiers. Master's thesis, University of Twente.
Lee, Kyong-Tae and Schmitz, J. and Brown, G.A. and Heh, Dawei and Choi, Rino and Harris, R. and Song, Seung-Chul and Lee, Byoung Hun and Han, In-Shik and Lee, Hi-Deok and Jeong, Yoon-Ha (2007) Test structures for accurate UHF C-V measurements of nano-scale CMOSFETs with HfSiON and TiN metal gate. In: Proceedings of the 2007 IEEE International Conference on Microelectronic Test Structures, 19-22 March 2007, Tokyo, Japan.. pp. 124-127. IEEE Computer Society. ISBN 1-4244-0781-8
Sasse, G.T. and de Vries, R.J. and Schmitz, J. (2007) Methodology for performing RF reliability experiments on a generic test structure. In: 20th ICMTS Conference Proceedings, 19-22 Mar 2007, Tokyo, Japan. pp. 177-182. IEEE Computer Society. ISBN 1-4244-0780-X

2006

Acar, M. and Annema, A.-J. and Nauta, B. (2006) Generalized analytical design equations for variable slope class-e power amplifiers. In: Proceedings of 13th IEEE International Conference on Electronics, Circuits and Systems, 10-13-2006, Nice, France. pp. 431-434. IEEE Press. ISBN 1-4244-0395-2
Salm, C. and Hof, A.J. and Kuper, F.G. and Schmitz, J. (2006) Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. Microelectronics reliability, 46 (9-11). pp. 1617-1622. ISSN 0026-2714 *** ISI Impact 1,202 ***
Sasse, G.T. and Schmitz, J. (2006) Charge Pumping at radio Frequencies: Methodology, Trap Response and Application. In: Proceedings of International Reliability Physics Symposium IRPS 2006, 26-30 Mar 2006, San Jose, CA, USA. pp. 627-628. IEEE. ISBN 0-7803-9498-4
Sasse, G.T. and Schmitz, J. (2006) Interface trap response to RF charge pumping measurements. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands. pp. 427-431. Technology Foundation STW. ISBN 978-90-73461-44-4

2005

Sasse, G.T. and de Vries, H. and Schmitz, J. (2005) Charge pumping at radio frequencies [MOSFET device interface state density measurement]. In: 2005 International Conference on Microelectronic Test Structures, 2005, 4-7 April 2005, Leuven, Belgium. pp. 229-233. IEEE Computer Society. ISBN 0780388550
Sasse, G.T. and de Vries, H. and Schmitz, J. (2005) The RF charge pump technique for measuring the interface state density on leaky dielectrics. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005), 17-18 November 2005, Veldhoven, The Netherlands. pp. 47-51. Technology Foundation STW. ISBN 90-73461-50-2
Tiemeijer, L.F. and Havens, R.J. and de Kort, R. and Scholten, A.J. and van Langevelde, R. and Klaassen, D.B.M. and Sasse, G.T. and Bouttement, Y. and Petot, C. and Bardy, S. and Gloria, D. and Scheer, P. and Boret, S. and van Haaren, B. and Clement, C. and Larchanche, J-F. and Lim, I-S. and Duvallet, A. and Zlotnicka, A. (2005) Record RF performance of standard 90 nm CMOS technology. In: IEEE International Electron Devices Meeting 2004, 13-15 December 2004, San Francisco, California, USA. pp. 441-444. IEEE Computer Society. ISBN 0780386841

2004

Sasse, G.T. and de Kort, R. and Schmitz, J. (2004) Gate-capacitance extraction from RF C-V measurements. In: The 34th European Solid-State Device Research conference, 2004, 21-23 September 2004, Leuven, Belgium. pp. 113-116. IEEE Computer Society. ISBN 0780384784