EEMCS

Home > Publications
Home University of Twente
Education
Research
Prospective Students
Jobs
Publications
Intranet (internal)
 
 Nederlands
 Contact
 Search
 Organisation

EEMCS EPrints Service


Research Project: Reliability of display devices
Home Policy Brochure Browse Search User Area Contact Help

2006

Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2006) Current Degradation of a-Si:H/SiN TFTs at Room Temperature and Low Voltages. IEEE Transactions on Electron Devices, 53 (9). pp. 2273-2279. ISSN 0018-9383 *** ISI Impact 2,207 ***
Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2006) Determination of the contribution of defect creation and charge trapping to the degradation of a-Si:H/SiN TFTs at room temperature and low voltages. Journal of Non-Crystalline Solids, 352 (36-37). pp. 3849-3853. ISSN 0022-3093 *** ISI Impact 1,825 ***

2004

Merticaru, A.R. (2004) Electrical instability of a-Si:H/SiN thin film transistors : a study at room temperature and low voltage stress. PhD thesis, University of Twente. ISBN 90-365-2056-8

2003

Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2003) Progressive degradation in a-Si: H/SiN thin film transistors. Thin Solid Films, 427 (1-2). 60-66. ISSN 0040-6090 *** ISI Impact 1,761 ***

2002

Golo-Tosic, N. (2002) Electrostatic discharge effects in thin film transistors. PhD thesis, University of Twente. ISBN 9036518091
Golo-Tosic, N. and Jenneboer, A.J.S.M. and Mouthaan, A.J. (2002) Dealing with electrostatic discharge in a capacitive fingerprint sensor fabricated in amorphous silicon thin film technology. In: Proceedings of Semiconductor Sensor and Actuator Technology SeSens 2002, 29 Nov 2002, Veldhoven, The Netherlands. pp. 616-621. Technology Foundation STW. ISBN 90-73461-33-2
Golo-Tosic, N. and Kuper, F.G. and Mouthaan, A.J. (2002) Analysis of the electrical breakdown in hydrogenated amorphous silicon thin-film transistors. IEEE transactions on electron devices, 49 (6). pp. 1012-1018. ISSN 0018-9383 *** ISI Impact 2,207 ***
Golo-Tosic, N. and Kuper, F.G. and Mouthaan, A.J. (2002) Zapping thin film transistors. Microelectronics Reliability, 42 (4). pp. 747-765. ISSN 0026-2714 *** ISI Impact 1,202 ***
Golo-Tosic, N. and van der Wal, S. and Kuper, F.G. and Mouthaan, A.J. (2002) Estimation of the impact of electrostatic discharge on density of states in hydrogenated amorphous silicon thin-film transistors. Applied Physics Letters, 80 (18). pp. 3337-3339. ISSN 0003-6951 *** ISI Impact 3,142 ***

2001

Golo-Tosic, N. and van der Wal, S. and Kuper, F.G. and Mouthaan, A.J. (2001) The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin film transistors. Microelectronics Reliability, 41 (9-10). pp. 1391-1396. ISSN 0026-2714 *** ISI Impact 1,202 ***
Merticaru, A.R. and Mouthaan, A.J. (2001) Dynamics of metastable defects in a-Si:H/SiN TFTs. Thin solid Films, 383 (1-2). pp. 122-124. ISSN 0040-6090 *** ISI Impact 1,761 ***
Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2001) Study of dynamics of charge trapping in a-Si:H/SiN TFTs. In: Proceedings of the 4th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2001, 29-30 Nov 2001, Veldhoven, The Netherlands. pp. 109-114. Technology Foundation STW. ISBN 90-73461-29-4