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Research Project: Reduction of 1/f Noise in MOSFETs by Switched Bias Techniques
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2007

Salm, C. and Hoekstra, E. and Kolhatkar, J.S. and Hof, A.J. and Wallinga, H. and Schmitz, J. (2007) Low-frequency noise in hot-carrier degraded nMOSFETs. Microelectronics reliability, 47 (4-5). pp. 577-580. ISSN 0026-2714 *** ISI Impact 1,202 ***
van der Wel, A.P. and Klumperink, E.A.M. and Kolhatkar, J.S. and Hoekstra, E. and Snoeij, M.F. and Salm, C. and Wallinga, H. and Nauta, B. (2007) Low-frequency noise phenomena in switched MOSFETs. IEEE journal of solid-state circuits, 42 (3). pp. 540-550. ISSN 0018-9200 *** ISI Impact 3,299 ***

2005

Kolhatkar, J.S. (2005) Steady-state and cyclo-stationary RTS noise in mosfets. PhD thesis, University of Twente. ISBN 90-365-2127-0
Kolhatkar, J.S. and Hoekstra, E. and Hof, A.J. and Salm, C. and Schmitz, J. and Wallinga, H. (2005) Impact of hot-carrier degradation on the Low-Frequency Noise in MOSFETs under steady-state and periodic Large-Signal Excitation. IEEE electron device letters, 26 (10). pp. 764-766. ISSN 0741-3106 *** ISI Impact 2,528 ***
Kolhatkar, J.S. and Salm, C. and Knitel, M.J. and Wallinga, H. (2005) Constant and switched bias low frequency noise in p-MOSFETs with varying gate oxide thickness. In: Proceedings of the 32nd European Solid-State Device Research Conference, 24-26 September 2002, University of Bologna, Italia. pp. 83-86. IEEE Computer Society. ISBN 88-900847-8-2

2004

Kolhatkar, J.S. and Vandamme, L.K.J. and Salm, C. and Wallinga, H. (2004) Separation of random telegraph sSignals from 1/f noise in MOSFETs under constant and switched bias conditions. In: 33rd Conference on European Solid-State Device Research 2003 (ESSDERC), 16-18 September 2003, Estoril, Portugal. pp. 549-552. IEEE Computer Society. ISBN 0780379993

2003

Kolhatkar, J.S. and Salm, C. and Wallinga, H. (2003) Separation of random telegraph signals from 1/f noise in MOSFETs. In: Proceedings of the 6th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2003, 25 - 26 November 2003, Veldhoven, The Netherlands. pp. 614-617. Technology Foundation STW. ISBN 90-73461-39-1
Kolhatkar, J.S. and van der Wel, A.P. and Klumperink, E.A.M. and Salm, C. and Nauta, B. and Wallinga, H. (2003) Measurement and extraction of RTS parameters under 'Switched Biased' conditions in MOSFETS. In: 17th International Conference on Noise and Fluctuations, 18-22 August 2003, Prague, Czech Republic. pp. 237-240. Czech Noise Research Laboratory (CNRL). ISBN 8023910051

2002

Kolhatkar, J.S. and Salm, C. and Wallinga, H. (2002) Analysis of 'Switched Biased' random telegraph signals in MOSFETs. In: Proceedings of the 5th annual workshop on Semiconductors Advances for Future Electronics SAFE 2002, 27-28 November 2002, Veldhoven, The Netherlands. pp. 42-45. Technology Foundation STW. ISBN 90-73461-33-2

2001

Kolhatkar, J.S. and Salm, C. and Wallinga, H. (2001) 1/f noise and switched bias noise measurement in p-MOSFET with varying gate oxide thickness. In: Proceedings of the 4th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2001, 28-30 Nov 2001, Veldhoven, The Netherlands. pp. 92-95. Technology Foundation STW. ISBN 90-73461-29-4