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Research Project: RF reliability: High Performance Mixed-Signal Design High Reliability and high voltage
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2016

Boksteen, B.K. and Schmitz, J. and Hueting, R.J.E. (2016) Interface trap density estimation in FinFETs using the gm/ID Method in the subthreshold regime. IEEE transactions on electron devices, 63 (5). pp. 1814-1820. ISSN 0018-9383 *** ISI Impact 2,207 ***

2015

Boksteen, B.K. (2015) Field-plate assisted RESURF power devices: Gradient based optimization, degradation and analysis. PhD thesis, University of Twente. ISBN 978-90-365-3931-9
Boksteen, B.K. and Heringa, A. and Ferrara, A. and Steeneken, P.G. and Schmitz, J. and Hueting, R.J.E. (2015) Electric field and interface charge extraction in field-plate assisted RESURF devices. IEEE transactions on electron devices, 62 (2). pp. 622-629. ISSN 0018-9383 *** ISI Impact 2,207 ***

2014

Boksteen, B.K. and Ferrara, A. and Heringa, A. and Steeneken, P.G. and Hueting, R.J.E. (2014) Impact of interface charge on the electrostatics of field-plate assisted RESURF devices. IEEE transactions on electron devices, 61 (8). pp. 2859-2866. ISSN 0018-9383 *** ISI Impact 2,207 ***

2013

Boksteen, B.K. and Ferrara, A. and Heringa, A. and Steeneken, P.G. and Koops, G.E.J. and Hueting, R.J.E. (2013) Design optimization of field-plate assisted RESURF devices. In: 25th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2013, 26-30 May 2013 , Kanazawa , Japan. pp. 237-240. IEEE Circuits & Systems Society. ISSN 1943-653X ISBN 978-1-4673-5134-8

2012

Boksteen, B.K. and Dhar, S. and Heringa, A. and Koops, G.E.J. and Hueting, R.J.E. (2012) Extraction of the Electric Field in Field Plate Assisted RESURF Devices. In: Proceedings of 24th International Symposium on Power Semiconductor Devices and ICs (ISPSD 2012) , Bruges, Belgium. pp. 145-148. IEEE Electron Devices Society. ISSN 1943-653X ISBN 978-1-4577-1594-5

2010

Boksteen, B.K. and Hueting, R.J.E. and Salm, C. and Schmitz, J. (2010) An Initial study on The Reliability of Power Semiconductor Devices. In: Proceedings of STW.ICT Conference 2010, 18-19 Nov 2010, Veldhoven, The Netherlands. pp. 68-72. Technology Foundation STW. ISBN 978-90-73461-67-3