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2010
Boksteen, B.K. and Hueting, R.J.E. and Salm, C. and Schmitz, J.
(2010)
An Initial study on The Reliability of Power Semiconductor Devices.
In: Proceedings of STW.ICT Conference 2010, 18-19 Nov 2010, Veldhoven, The Netherlands.
pp. 68-72.
Technology Foundation STW.
ISBN 978-90-73461-67-3
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