EEMCS

Home > Publications
Home University of Twente
Education
Research
Prospective Students
Jobs
Publications
Intranet (internal)
 
 Nederlands
 Contact
 Search
 Organisation

EEMCS EPrints Service


Research Project: MEMPHIS-2: Silicon-based Detector/imager/led Technology
Home Policy Brochure Browse Search User Area Contact Help

2016

Liu, Xingyu and Nanver, L.K. (2016) Comparing current flows in ultrashallow pn-/Schottky-like diodes with 2-diode test method. In: Microelectronic Test Structures (ICMTS), 2016 International Conference on , 28-31 Mar 2016, Yokohama, Japan. pp. 190-195. IEEE. ISBN 978-1-4673-8791-0