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Research Project: HVME: Reliability Of HVME Switches
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2016

Ferrara, A. (2016) RESURF power semiconductor devices - Performance and operating limits. PhD thesis, University of Twente. ISBN 978-90-365-4032-2

2015

Ferrara, A. and Boksteen, B.K. and Hueting, R.J.E. and Heringa, A. and Schmitz, J. and Steeneken, P.G. (2015) Ideal RESURF Geometries. IEEE transactions on electron devices, 62 (10). pp. 3341-3347. ISSN 0018-9383 *** ISI Impact 2,207 ***
Ferrara, A. and Boksteen, B.K. and Schmitz, J. and Hueting, R.J.E. and Steeneken, P.G. and Heringa, A. and Claes, J. and Van der Wel, A. (2015) The boost transistor: a field plate controlled LDMOST. Proceedings of the 27th International Symposium on Power Semiconductor Devices & IC's, 27. pp. 165-168. ISSN 1943-653X
Ferrara, A. and Steeneken, P.G. and Boksteen, B.K. and Heringa, A. and Scholten, A.J. and Schmitz, J. and Hueting, R.J.E. (2015) Physics-based stability analysis of MOS transistors. Solid-state electronics, 113. pp. 28-34. ISSN 0038-1101 *** ISI Impact 1,345 ***

2013

Ferrara, A. and Boksteen, B.K. and Schmitz, J. and Hueting, R.J.E. and Steeneken, P.G. and Reimann, K. and Heringa, A. and Yan, Liang and Swanenberg, M. and Koops, G.E.J. and Scholten, A.J. and Surdeanu, R. (2013) Comparison of electrical techniques for temperature evaluation in power MOS transistors. In: IEEE International Conference on Microelectronic Test Structures (ICMTS 2013), 25-28 Mar 2013, San Diego, CA, USA. pp. 115-120. IEEE Circuits & Systems Society. ISSN 1071-9032 ISBN 978-1-4673-4848-5
Ferrara, A. and Steeneken, P.G. and Heringa, A. and Boksteen, B.K. and Swanenberg, M. and Scholten, A.J. and van Dijk, L. and Schmitz, J. and Hueting, R.J.E. (2013) The safe operating volume as a general measure for the operating limits of LDMOS transistors. In: International Electron Devices Meeting (IEDM 2013), 9-11 Dec 2013, Washington, DC. 6.7.1-6.7.4 . IEEE Electron Devices Society. ISBN 978-1-4799-2306-9