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Research Project: FERROFET: Integration Of Ferroelectrics On Cmos
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2015

Hueting, R.J.E. and van Hemert, T. and Kaleli, B. and Wolters, R.A.M. and Schmitz, J. (2015) On device architectures, subthreshold swing, and power consumption of the piezoelectric field-effect transistor (π-FET). Journal of the Electron Devices Society, 3 (3). pp. 149-157. ISSN 2168-6734 *** ISI Impact 1,543 ***

2013

van Hemert, T. (2013) Tailoring strain in microelectronic devices. PhD thesis, University of Twente. ISBN 978-90-365-1169-8
van Hemert, T. and Hueting, R.J.E. (2013) Piezoelectric strain modulation in FETs. IEEE transactions on electron devices, 60 (10). pp. 3265-3270. ISSN 0018-9383 *** ISI Impact 2,207 ***
van Hemert, T. and Kaleli, B. and Hueting, R.J.E. and Esseni, D. and van Dal, M.J.H. and Schmitz, J. (2013) Strain and conduction-band offset in narrow n-type finFETs. IEEE transactions on electron devices, 60 (3). pp. 1005-1010. ISSN 0018-9383 *** ISI Impact 2,207 ***

2012

van Hemert, T. and Hueting, R.J.E. (2012) Active strain modulation in field effect devices. In: Solid-State Device Research Conference (ESSDERC), 2012 Proceedings of the European, 17-21 Sept 2012, Bordeaux, France. pp. 125-128. IEEE Solid-State Circuits Society. ISSN 1930-8876 ISBN 978-1-4673-1706-1
van Hemert, T. and Reimann, K. and Hueting, R.J.E. (2012) Extraction of second order piezoelectric parameters in bulk acoustic wave resonators. Applied physics letters, 100 (23). 232901:1-232901:4. ISSN 0003-6951 *** ISI Impact 3,142 ***

2011

van Hemert, T. and Kaleli, B. and Hueting, R.J.E. and Esseni, D. and van Dal, M.J.H. and Schmitz, J. (2011) Extracting the Conduction Band Offset in Strained FinFETs from Subthreshold-Current Measurements. In: Proceedings of the 41st European Solid-State Device Research Conference (Essderc 2011), 12-16 Sep 2011, Helsinki, Finland. pp. 275-278. IEEE Solid-State Circuits Society. ISBN 978-1-4577-0708-7
van Hemert, T. and Sakriotis, D. and Hueting, R.J.E. and Schmitz, J. (2011) Exploring Capacitance-Voltage measurements to find the Piezoelectric Coefficient of Aluminum Nitride. In: 24th International Conference on Microelectronic Test Structures, ICMTS 2011, 4-7 Apr 2011, Amsterdam. pp. 69-73. IEEE Electron Devices Society. ISSN 1071-9032 ISBN 978-1-4244-8527-7