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OrganisationEEMCS EPrints Service
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2011
van Hemert, T. and Kaleli, B. and Hueting, R.J.E. and Esseni, D. and van Dal, M.J.H. and Schmitz, J.
(2011)
Extracting the Conduction Band Offset in Strained FinFETs from Subthreshold-Current Measurements.
In: Proceedings of the 41st European Solid-State Device Research Conference (Essderc 2011), 12-16 Sep 2011, Helsinki, Finland.
pp. 275-278.
IEEE Solid-State Circuits Society.
ISBN 978-1-4577-0708-7
van Hemert, T. and Sakriotis, D. and Hueting, R.J.E. and Schmitz, J.
(2011)
Exploring Capacitance-Voltage measurements to find the Piezoelectric Coefficient of Aluminum Nitride.
In: 24th International Conference on Microelectronic Test Structures, ICMTS 2011, 4-7 Apr 2011, Amsterdam.
pp. 69-73.
IEEE Electron Devices Society.
ISSN 1071-9032
ISBN 978-1-4244-8527-7
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