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Research Project: ESD CDM protection Circuits
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2005

Sowariraj, M.S.B. (2005) Full chip modelling of ICs under CDM stress. PhD thesis, University of Twente. ISBN 90-365-2217-X
Sowariraj, M.S.B. and de Jong, P.C. and Salm, C. and Mouthaan, A.J. and Kuper, F.G. (2005) A 3-D circuit model to evaluate CDM performance of Ics. Microelectronics Reliability, 45 (9-11). pp. 1425-1429. ISSN 0026-2714 *** ISI Impact 1,202 ***
Sowariraj, M.S.B. and de Jong, P.C. and Salm, C. and Smedes, T. and Mouthaan, A.J. and Kuper, F.G. (2005) Significance of including substrate capacitance in the full chip circuit model of ICs under CDM stress. In: 43rd Annual IEEE International Reliability Physics Symposium, 2005, 17-21 April 2005, San Jose, California, USA. pp. 608-609. IEEE Computer Society. ISBN 0780388038

2003

Sowariraj, M.S.B. and Smedes, T. and Salm, C. and Mouthaan, A.J. and Kuper, F.G. (2003) Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels - An explantion and die protection strategy. Microelectronics Reliability, 43 (9-11). pp. 1569-1575. ISSN 0026-2714 *** ISI Impact 1,202 ***
Sowariraj, M.S.B. and Smedes, T. and Salm, C. and Mouthaan, A.J. and Kuper, F.G. (2003) Study on the influence of package parasitics and substrate resistance on the Charged Device Model(CDM) failure levels - possible protection methodology. In: Proceedings of the 6th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2003, 25 - 26 November 2003, Veldhoven, The Netherlands. pp. 657-662. Technology Foundation STW. ISBN 90-73461-39-1

2002

Sowariraj, M.S.B. and Kuper, F.G. and Salm, C. and Mouthaan, A.J. and Smedes, T. (2002) Impact of layout and technology variation on the CDM performance of ggNMOSTs and SCRs. In: Proceedings of the 5th annual workshop on Semiconductors Advances for Future Electronics SAFE 2002, 27-28 November 2002, Veldhoven, The Netherlands. pp. 104-107. Technology Foundation STW. ISBN 90-73461-33-2
Sowariraj, M.S.B. and Salm, C. and Mouthaan, A.J. and Smedes, T. and Kuper, F.G. (2002) The influence of technology variation on ggNMOSTs and SCRs against CDM ESD stress. Microelectronics Reliability, 42 (9-11). pp. 1287-1292. ISSN 0026-2714 *** ISI Impact 1,202 ***