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Research Project: EMPATIE: DSP Qualification of Mixed-Signal Cores via Embedded Processors in Video SoCs
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2014

Sheng, Xiaoqin (2014) ADC testing using digital stimuli. PhD thesis, Univ. of Twente. CTIT Ph.D.-thesis series No. 14-343 ISBN 978-90-365-3607-3

2012

Sheng, Xiaoqin and Kerkhoff, H.G. and Zjajo, A. and Gronthoud, G. (2012) ADC multi-site test based on a pre-test with digital input stimulus. Journal of Electronic Testing: Theory and Applications, 28 (4). pp. 393-404. ISSN 0923-8174 ISBN 978-1-4577-0711-7 *** ISI Impact 0,361 ***

2010

Krishnan, S. and Kerkhoff, H.G. and Doornbosch, K.D. and Brand, R. (2010) BlockLevel Bayesian Diagnosis of Analogue Electronic Circuits. In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, 8-12 Mar 2010, Dresden, Germany. pp. 1767-1772. IEEE. ISSN 1530-1591 ISBN 978-1-4244-7054-9
Sheng, Xiaoqin and Kerkhoff, H.G. (2010) Improved method for SNR prediction in machine-learning-based test. In: 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010, 07-09 June 2010, La Grande Motte, France. pp. 1-4. IEEE Computer Society. ISBN 978-1-4244-7792-0
Sheng, Xiaoqin and Kerkhoff, H.G. (2010) The test ability of an adaptive pulse wave for ADC testing. In: Proceedings of the IEEE 19th Asian Test Symposium (ATS 2010), 1-4 December 2010, Shanghai, China. pp. 289-294. IEEE Computer Society. ISBN 978-0-7695-4248-5
Sheng, Xiaoqin and Kerzerho, V.A. and Kerkhoff, H.G. (2010) Predicting dynamic specifications of ADCs with a low-quality digital input signal. In: Proceedings of the 15th European Test Symposium, ETS 2010, 24-28 May 2010 , Prague, Czech Republic. pp. 158-163. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4244-5834-9

2009

Sheng, Xiaoqin and Kerkhoff, H.G. (2009) Two improved methods for testing ADC parametric faults by digital input signals. In: IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop, IMSTW 2009, 10-12 June 2009, Scottsdale, AZ. pp. 1-5. IEEE Computer Society. ISBN 978-1-4244-4618-6
Sheng, Xiaoqin and Kerkhoff, H.G. and Zjajo, A. and Gronthoud, G. (2009) Algorithms for ADC multi-site test with digital input stimulus. In: Proceedings of the 2009 14th European Test Symposium, 25-29 May 2009, Seville, Spain. pp. 45-50. IEEE Computer Society. ISBN 978-0-7695-3703-0

2008

Sheng, Xiaoqin and Kerkhoff, H.G. and Zjajo, A. and Gronthoud, G. (2008) Exploring dynamics of embedded ADC through adapted digital input stimuli. In: 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE, 18-20 Jun 2008, Vancouver, BC. pp. 1-7. IEEE Computer Society. ISBN 978-1-4244-2395-8