EEMCS EPrints Service
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2010
Krishnan, S. and Kerkhoff, H.G. and Doornbosch, K.D. and Brand , R.
(2010)
BlockLevel Bayesian Diagnosis of Analogue Electronic Circuits.
In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, 8-12 Mar 2010, Dresden, Germany.
pp. 1767-1772.
IEEE.
ISSN 1530-1591
ISBN 978-1-4244-7054-9
Sheng, Xiaoqin and Kerkhoff, H.G.
(2010)
Improved method for SNR prediction in machine-learning-based test.
In: 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010, 07-09 June 2010, La Grande Motte, France.
pp. 1-4.
IEEE Computer Society.
ISBN 978-1-4244-7792-0
Sheng, Xiaoqin and Kerkhoff, H.G.
(2010)
The test ability of an adaptive pulse wave for ADC testing.
In: Proceedings of the IEEE 19th Asian Test Symposium (ATS 2010), 1-4 December 2010, Shanghai, China.
pp. 289-294.
IEEE Computer Society.
ISBN 978-0-7695-4248-5
Sheng, Xiaoqin and Kerzerho, V.A. and Kerkhoff, H.G.
(2010)
Predicting dynamic specifications of ADCs with a low-quality digital input signal.
In: Proceedings of the 15th European Test Symposium, ETS 2010, 24-28 May 2010 , Prague, Czech Republic.
pp. 158-163.
IEEE Computer Society.
ISSN 1530-1877
ISBN 978-1-4244-5834-9
2009
Sheng, Xiaoqin and Kerkhoff, H.G.
(2009)
Two improved methods for testing ADC parametric faults by digital input signals.
In: IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop, IMSTW 2009, 10-12 June 2009, Scottsdale, AZ.
pp. 1-5.
IEEE Computer Society.
ISBN 978-1-4244-4618-6
Sheng, Xiaoqin and Kerkhoff, H.G. and Zjajo, A. and Gronthoud, G.
(2009)
Algorithms for ADC multi-site test with digital input stimulus.
In: Proceedings of the 2009 14th European Test Symposium, 25-29 May 2009, Seville, Spain.
pp. 45-50.
IEEE Computer Society.
ISBN 978-0-7695-3703-0
2008
Sheng, Xiaoqin and Kerkhoff, H.G. and Zjajo, A. and Gronthoud, G.
(2008)
Exploring dynamics of embedded ADC through adapted digital input stimuli.
In: 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE, 18-20 Jun 2008, Vancouver, BC.
pp. 1-7.
IEEE Computer Society.
ISBN 978-1-4244-2395-8
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