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Research Project: ELESIS: European Library Based Flow Of Embedded Silicon Test Instruments
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2016

Ibrahim, A.M.Y. and Kerkhoff, H.G. (2016) Analysis and design of an on-chip retargeting engine for IEEE 1687 networks. In: 21st IEEE European Test Symposium (ETS 2016), 23-26 May 2016, Amsterdam, The Netherlands. pp. 1-6. IEEE Circuits & Systems Society. ISBN 978-1-4673-9659-2
Ibrahim, A.M.Y. and Kerkhoff, H.G. (2016) Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management. In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 19-20 Sept 2016, Storrs, CT, USA. pp. 97-102. IEEE Computer Society. ISBN 978-1-5090-3623-3
Ibrahim, A.M.Y. and Kerkhoff, H.G. (2016) Towards an automated and reusable in-field self-test solution for MPSoCs. In: 28th International Conference on Microelectronics (ICM 2016), 17-20 Dec 2016, Giza, Egypt. pp. 249-252. IEEE Computer Society. ISBN 978-1-5090-5721-4

2015

Ibrahim, A.M.Y. and Kerkhoff, H.G. (2015) A system level approach for a dependable heterogeneous MPSoC. In: Supplemental Proceeding of The 45th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, 22-25 June 2015, Rio de Janeiro, Brazil. 141082. Sociedade Brasileira de Computaçao - SBC. ISBN 978-85-88442-97-9
Wan, Jinbo and Kerkhoff, H.G. (2015) Embedded instruments for enhancing dependability of analogue and mixed-signal IPs. In: NIEEE 13th International New Circuits and Systems Conference, NEWCAS 2015, 7-10 June 2015, Grenoble, France. pp. 1-4. IEEE Circuits & Systems Society. ISBN 978-1-4799-8893-8
Wan, Jinbo and Kerkhoff, H.G. (2015) Reliability of SAR ADCs and associated embedded instrument detection. In: 20th International Mixed-Signal Testing Workshop, IMSTW 2015, 24-26 June 2015, Paris, France. pp. 1-5. IEEE Computer Society. ISBN 978-1-4673-6732-5
Wan, Jinbo and Kerkhoff, H.G. (2015) New drain current model for nano-meter MOS transistors on-chip threshold voltage test. In: 20th IEEE European Test Symposium, ETS 2015, 25-29 May 2015, Cluj-Napoca, Romania. pp. 1-6. IEEE Computer Society. ISBN 978-1-4799-7603-4
Zambrano Constantini, A.C. and Kerkhoff, H.G. (2015) Online digital offset voltage compensation method for AMR sensors. In: IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015, 11-14 May 2015, Pisa, Italy. pp. 1512-1515. IEEE Instrumentation & Measurement Society. ISBN 978-1-4799-6113-9
Zambrano Constantini, A.C. and Kerkhoff, H.G. (2015) Determination of the aging offset voltage of AMR sensors based on accelerated degradation test. In: 20th International Mixed-Signal Testing Workshop, IMSTW 2015, 24-26 Jun 2015, Paris, France. pp. 1-5. IEEE . ISBN 978-1-4673-6732-5
Zambrano Constantini, A.C. and Kerkhoff, H.G. (2015) Fault-tolerant system for catastrophic faults in AMR sensors. In: IEEE 21st International On-Line Testing Symposium, IOLTS 2015, 6-8 July 2015, Halkidiki, Greece. pp. 65-70. IEEE. ISBN 978-1-4673-7904-5

2014

Ibrahim, A.M.Y. and Kerkhoff, H.G. (2014) iJTAG integration of complex digital embedded instruments. (Invited) In: 9th International Design & Test Symposium, IDT 2014, 16-18 Dec 2014, Algiers, Algeria. pp. 18-23. IEEE Computer Society. ISBN 978-1-4799-8200-4
Khan, M.A. and Kerkhoff, H.G. (2014) Studying DAC capacitor-array degradation in charge-redistribution SAR ADCs. In: 17th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, 23-25 April 2014, Warsaw, Poland. pp. 15-20. IEEE . ISBN 978-1-4799-4558-0
Rohani, A. (2014) Modelling and mitigation of soft-errors in CMOS processors. PhD thesis, univ. of Twente. CTIT Ph.D.-thesis series No. 15-346 ISBN 9789036538077
Rohani, A. and Kerkhoff, H.G. (2014) Two soft-error mitigation techniques for functional units of DSP processors. In: 19th IEEE European Test Symposium, ETS 2014 , 28-30 May 2014, Paderborn, Germany. pp. 1-6. IEEE Computer Society. ISBN 978-1-4799-3415-7
Wan, Jinbo and Kerkhoff, H.G. (2014) An embedded offset and gain instrument for OpAmp IPs. In: Design, Automation and Test in Europe Conference and Exhibition, DATE 2014, 24-28 Mar 2014, Dresden, Germany. pp. 1-4. Electronic Design Automation Publishing Association. ISBN 978-3-9815370-2-4

2013

Khan, M.A. and Kerkhoff, H.G. (2013) An indirect technique for estimating reliability of analog and mixed-signal systems during operational life. In: 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, 8-10 April 2013, Karlovy Vary, Czech Republic. pp. 159-164. IEEE . ISBN 978-1-4673-6135-4
Rohani, A. and Kerkhoff, H.G. (2013) Functional unit for a processor. Patent EP13191370.9 (Application).
Wan, Jinbo and Kerkhoff, H.G. (2013) An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations. In: 14th International Symposium on Quality Electronic Design (ISQED 2013), 4-6 Mar 2013, Santa Clara, CA, USA. pp. 31-37. International Society for Quality Electronic Design. ISSN 1948-3295 ISBN 978-1-4673-4953-6