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2013

Bossers, H.C.M. and Hurink, J.L. and Smit, G.J.M. (2013) Selection of tests for outlier detection. In: 31st IEEE VLSI Test Symposium, VTS 2013, 29 Apr - 2 May 2013, Berkeley, CA, USA. pp. 1-6. IEEE Computer Society. ISSN 1093-0167 ISBN 978-1-4673-5542-1

2011

Bossers, H.C.M. and Hurink, J.L. and Smit, G.J.M. (2011) Online Univariate Outlier Detection in Final Test: A Robust Rolling Horizon Approach. In: 16th IEEE European Test Symposium, ETS 2011, 23-27 May 2011, Trondheim, Norway. pp. 201-201. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4577-0483-3
Bossers, H.C.M. and Hurink, J.L. and Smit, G.J.M. (2011) Online Bivariate Outlier Detection in Final Test Using Kernel Density Estimation. In: IEEE Defect and Adaptive Test Analysis Workshop, 22-23 Sept 2011, Anaheim, USA. IEEE Computer Society. ISBN not assigned