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Research Project: DCIS: Data Collection Colonies In Space
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2016

Boonstra, A.J. and Garrett, M. and Kruithof, G. and Wise, M. and Bentum, M.J. and e, all (2016) Discovering the sky at the longest wavelengths (DSL). In: 2016 IEEE Aerospace Conference, 5-12 Mar 2016, Big Sky, MT, USA. pp. 1-20. IEEE Aerospace and Electronic Systems Society. ISBN 978-1-4673-7676-1
van Vugt, P.K.A. and Meijerink, A. and Bentum, M.J. (2016) Calibration of the OLFAR space-based radio telescope using an alternating least squares approach. In: 2016 IEEE Aerospace Conference, 5-12 Mar 2016, Big Sky, MT, USA. pp. 1-8. IEEE Aerospace and Electronic Systems Society. ISBN 978-1-4673-7676-1

2014

Buist, P.J. and Verhoeven, C.J.M. and Noroozi, A. and Heusdens, R. and Fernandes, J. and Kabakchiev, H. and Bentum, M.J. and Kestilä, A. (2014) PulsarPlane: a feasibility study for millisecond radio pulsar navigation. In: Proceedings of the 65th International Astronautical Congress (IAC2014), 29 Sep - 3 Oct 2014, Toronto, Canada. pp. 1-10. International Astronautical Federation (IAF). ISBN not assigned
van Vugt, P.K.A. and Budianu, A. and Meijerink, A. and Bentum, M.J. (2014) Calibration approach of the OLFAR space based radio telescope. In: Proceedings of the 65th International Astronautical Congress (IAC2014), 29 Sep - 3 Oct 2014, Toronto, Canada. pp. 1-7. International Astronautical Federation. ISBN not assigned

2013

van Vugt, P.K.A. and Bijman, R. and Timens, R.B. and Leferink, F.B.J. (2013) Impact of grounding and filtering on power insulation monitoring in insulated terrestrial power networks. In: Proceedings of the 2013 International Symposium on Electromagnetic Compatibility (EMC Europe), 2-6 Sept 2013, Brugge, Belgium. pp. 472-477. IEEE Electromagnetic Compatibility Society. ISBN 978-1-4673-4979-6
van Vugt, P.K.A. and Timens, R.B. and Stievano, I.S. and Leferink, F.B.J. and Canavero, F.G. (2013) Experimental characterization of CFL bulbs for power quality assessment. In: IEEE International Symposium on Electromagnetic Compatibility (EMC 2013), 5-9 Aug 2013, Denver, CO, USA. pp. 232-235. IEEE Electromagnetic Compatibility Society. ISBN 978-1-4799-0409-9