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EEMCS EPrints Service


Editor: Wan, Jinbo
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Number of items: 1.

2016

Wan, Jinbo and Kerkhoff, H.G. (2016) Simulating NBTI degradation in arbitrary stressed analog/mixed-signal environments. IEEE Transactions on Nanotechnology, 15 (2). pp. 137-148. ISSN 1536-125X *** ISI Impact 1,702 ***

This list was generated on Mon May 29 06:59:26 CEST 2017.