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Classification: SC-ICRY: Integrated Circuit Reliability and Yield
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2010

Knotter, D.M. and Wali, F. (2010) Particles in Semiconductor Processing. In: Developments in Surface Contamination and Cleaning - Methods for Removal of Particle Contaminants. Elsevier, Amsterdam, pp. 81-120. ISBN 978-1-4377-7830-4

2009

Rink, I. and Wali, F. and Knotter, D.M. (2009) Impact of metal-ion contaminated silica particles on gate oxide integrity. Solid State Phenomena, 145-146. pp. 131-134. ISSN 1012-0394
Wali, F. and Knotter, D.M. and Bearda, T. and Mertens, P.W. (2009) Local distribution of particles deposited on patterned surfaces. Solid State Phenomena, 145-146. pp. 65-68. ISSN 1012-0394
Wali, F. and Knotter, D.M. and Mud, A. and Kuper, F.G. (2009) Impact of particles in ultra pure water on random yield loss in IC production. Microelectronic engineering, 86 (2). pp. 140-144. ISSN 0167-9317 *** ISI Impact 1,277 ***

2008

Herfst, R.W. (2008) Degradation of RF MEMS capacitive switches. PhD thesis, University of Twente. ISBN 978-90-365-2750-7
Herfst, R.W. and Steeneken, P.G. and Huizing, H.G.A. and Schmitz, J. (2008) Center-Shift Method for the Characterization of Dielectric Charging in RF MEMS Capacitive Switches. IEEE Transactions on Semiconductor Manufacturing, 21 (2). pp. 148-153. ISSN 0894-6507 *** ISI Impact 1,045 ***
Herfst, R.W. and Steeneken, P.G. and Schmitz, J. (2008) Identifying degradation mechanisms in RF MEMS capacitive switches. In: Proceedings of the 21st IEEE International Conference on Micro Electro Mechanical Systems, 13-17 Jan 2008, Tucson, AZ, USA. pp. 168-171. IEEE Computer Society. ISBN 978-1-4244-1793-3
Herfst, R.W. and Steeneken, P.G. and Schmitz, J. and Mank, A.J.G. and van Gils, M. (2008) Kelvin probe study of laterally inhomogeneous dielectric charging and charge diffusion in RF MEMS capacitive switches. In: Proceedings of the International Reliability Physics Symposium 2008, 27 Apr - 1 May 2008, Phoenix, AZ, USA. pp. 492-496. IEEE Computer Society. ISBN 978-1-4244-2050-6
Kuper, F.G. (2008) Automotive IC reliability: Elements of the battle towards zero defects. Microelectronics reliability, 48 (8-9). pp. 1459-1463. ISSN 0026-2714 *** ISI Impact 1,202 ***
Salm, C. and Blanco Carballo, V.M. and Melai, J. and Schmitz, J. (2008) Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip. Microelectronics reliability, 48 (8-9). pp. 1139-1143. ISSN 0026-2714 *** ISI Impact 1,202 ***
Sasse, G.T. (2008) Reliability engineering in RF CMOS. PhD thesis, University of Twente. ISBN 978-90-365-2690-6
Sasse, G.T. and Acar, M. and Kuper, F.G. and Schmitz, J. (2008) RF CMOS reliability simulations. Microelectronics reliability, 48 (8-9). pp. 1581-1585. ISSN 0026-2714 *** ISI Impact 1,202 ***
Sasse, G.T. and Kuper, F.G. and Schmitz, J. (2008) MOSFET Degradation Under RF Stress. IEEE transactions on electron devices, 55 (11). pp. 3167-3174. ISSN 0018-9383 *** ISI Impact 2,207 ***
Sasse, G.T. and Schmitz, J. (2008) Application and evaluation of the RF charge-pumping technique. IEEE transactions on electron devices, 55 (3). pp. 881-889. ISSN 0018-9383 *** ISI Impact 2,207 ***
Wali, F. and Knotter, D.M. and Kuper, F.G. (2008) Liquid-borne nano particles impact on the random yield during critical processes in IC’s production. In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands. pp. 513-515. Technology Foundation STW. ISBN 978-90-73461-56-7

2007

Nicollian, P.E. (2007) Physics of Trap Generation and Electrical Breakdown in Ultra-thin SiO2 and SiON Gate Dielectric Materials PhD thesis, University of Twente. ISBN 978-90-365-2563-3
Salm, C. and Hoekstra, E. and Kolhatkar, J.S. and Hof, A.J. and Wallinga, H. and Schmitz, J. (2007) Low-frequency noise in hot-carrier degraded nMOSFETs. Microelectronics reliability, 47 (4-5). pp. 577-580. ISSN 0026-2714 *** ISI Impact 1,202 ***
Sasse, G.T. and de Vries, R.J. and Schmitz, J. (2007) Methodology for performing RF reliability experiments on a generic test structure. In: 20th ICMTS Conference Proceedings, 19-22 Mar 2007, Tokyo, Japan. pp. 177-182. IEEE Computer Society. ISBN 1-4244-0780-X
Steeneken, P.G. and Suy, H. and Herfst, R.W. and Goossens, M. and van Beek, J. and Schmitz, J. (2007) Micro-elektromechanische schakelaars voor mobiele telefoons. Nederlands Tijdschrift voor Natuurkunde, 73e jaargang (9). pp. 314-317. ISSN 0926-4264
Wali, F. and Knotter, D.M. and Wortelboer, R. and Mud, A. (2007) Statistical relation between particle contaminations in ultra pure water and defects generated by process tools. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands. pp. 555-557. Technology Foundation STW. ISBN 978-90-73461-49-9
van der Wel, A.P. and Klumperink, E.A.M. and Kolhatkar, J.S. and Hoekstra, E. and Snoeij, M.F. and Salm, C. and Wallinga, H. and Nauta, B. (2007) Low-frequency noise phenomena in switched MOSFETs. IEEE journal of solid-state circuits, 42 (3). pp. 540-550. ISSN 0018-9200 *** ISI Impact 3,299 ***

2006

Hurley, P.K. and Cherkaoui, K. and Groenland, A.W. (2006) Electrically active interface defects in the (100)Si/SiOx/HfO2/TiN system: Origin, instabilities and passivation (Invited) In: 210th Meeting of The Electrochemical Society (ECS), October 29-November 3, 2006, Cancun, Mexico. pp. 97-110. ECS Transactions 3. The Electrochemical Society. ISSN 1938-5862
Kuper, F.G. and Fan, X.J. (2006) Reliability practice. In: Mechanics of Microelectronics. Solid Mechanics and Its Applications 141. Springer Verlag, London, pp. 35-63. ISBN 978-1-4020-4934-7
Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2006) Current Degradation of a-Si:H/SiN TFTs at Room Temperature and Low Voltages. IEEE Transactions on Electron Devices, 53 (9). pp. 2273-2279. ISSN 0018-9383 *** ISI Impact 2,207 ***
Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2006) Determination of the contribution of defect creation and charge trapping to the degradation of a-Si:H/SiN TFTs at room temperature and low voltages. Journal of Non-Crystalline Solids, 352 (36-37). pp. 3849-3853. ISSN 0022-3093 *** ISI Impact 1,825 ***
Salm, C. and Hoekstra, E. and Kolhatkar, J.S. and Hof, A.J. and Wallinga, H. and Schmitz, J. (2006) Low-Frequency noise in hot-carrier degraded MOSFETs. In: 14th workshop on dielectrics in microelectronics WODIM, 26-28 june 2006, Santa Tecla, Italy. pp. 64-65. ISBN not assigned
Salm, C. and Hof, A.J. and Kuper, F.G. and Schmitz, J. (2006) Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. Microelectronics reliability, 46 (9-11). pp. 1617-1622. ISSN 0026-2714 *** ISI Impact 1,202 ***
Sasse, G.T. and Schmitz, J. (2006) Charge Pumping at radio Frequencies: Methodology, Trap Response and Application. In: Proceedings of International Reliability Physics Symposium IRPS 2006, 26-30 Mar 2006, San Jose, CA, USA. pp. 627-628. IEEE. ISBN 0-7803-9498-4
Sasse, G.T. and Schmitz, J. (2006) Interface trap response to RF charge pumping measurements. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands. pp. 427-431. Technology Foundation STW. ISBN 978-90-73461-44-4
Wali, F. and Martin Knotter, D. and Kelly, J.J. and Kuper, F.G. (2006) Deposition and detection of particles during integrated circuit manufacturing. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands. pp. 483-487. Technology Foundation STW. ISBN 90-73461-44-8

2004

Nguyen, Van Hieu and Salm, C. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2004) Fast thermal cycling-enhanced electromigration in power metallization. IEEE Transactions on Device and Materials Reliability, 4 (2). pp. 246-255. ISSN 1530-4388 *** ISI Impact 1,437 ***