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Classification: SC-CICC: Characterization of IC Components
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2010

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Mauczock, R. and Keur, W. and Hueting, R.J.E. (2010) BaxSr1-xTi1.02O3 metal-insulator-metal capacitors on planarized alumina substrates Thin solid films, 518 (10). pp. 2854-2959. ISSN 0040-6090 *** ISI Impact 1,761 ***

2009

Andricciola, P. and Tuinhout, H.P. (2009) Influence of halo doping profiles on MOS transistor mismatch. In: Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, 26-27 Nov 2009, Veldhoven, The Netherlands. pp. 55-58. Technology Foundation STW. ISBN 978-90-73461-62-8
Furukawa, Y. and Reimann, K. and Jedema, F. and Tiggelman, M.P.J. and Roest, A.L. (2009) Tunable capacitor. Patent EP20090742493 (Application).
Klee, M. and van Esch, H. and Keur, W. and Kumar, B. and van Leuken-Peters, L. and Liu, Jin and Mauczock, R. and Neumann, K. and Reimann, K. and Renders, C. and Roest, A.L. and Tiggelman, M.P.J. and de Wild, M. and Wunnicke, O. and Zhao, Jing (2009) Ferroelectric Thin-Film Capacitors and Piezoelectric Switches for Mobile Communication Applications. IEEE transactions on ultrasonics, ferroelectrics and frequency control, 56 (8). pp. 1505-1512. ISSN 0885-3010 *** ISI Impact 2,287 ***
Tiggelman, M.P.J. (2009) Thin film barium strontium titanate capacitors for tunable RF front-end applications. PhD thesis, University of Twente. ISBN 978-90-365-2937-2
Tiggelman, M.P.J. and Reimann, K. (2009) Reconfigurable radio-frequency front-end. Patent EP20090786833 (Application).
Tiggelman, M.P.J. and Reimann, K. and Van Rijs, F. and Schmitz, J. and Hueting, R.J.E. (2009) On the trade-off between quality factor and tuning ratio in tunable high-frequency capacitors. IEEE transactions on electron devices, 56 (9). pp. 2128-2136. ISSN 0018-9383 *** ISI Impact 2,207 ***

2008

Kazmi, S.N.R. and Schmitz, J. (2008) Comparison of gate capacitance extraction methodologies. In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands. pp. 562-564. Technology Foundation STW. ISBN 978-90-73461-56-7
Klee, M. and Keur, W. and Mauczock, R. and van Esch, H. and de Wild, M. and Liu, J. and Roest, A.L. and Reimann, K. and Renders, C. and Peters, L. and Tiggelman, M.P.J. and Wunnicke, O. and Neumann, K. (2008) MI004 miniaturised, high performance ferroelectric and piezoelectric thin film devices. In: 17th IEEE International Symposium on the Applications of Ferroelectrics, 2008. ISAF 2008, 23-28 feb 2008, Santa Re, NM, USA. pp. 1-4. IEEE Computer Society. ISSN 1099-4734 ISBN 978-1-4244-2744-4

2007

Degraeve, R. and Schmitz, J. and Pantisano, L. and Simoen, E. and Houssa, M. and Kaczer, B. and Groeseneken, G. (2007) Electrical characterization of advanced gate dielectrics. In: Dielectric Films for Advanced Microelectronics. Wiley series in materials for electronic & optoelectronic applications. John Wiley & Sons Ltd., England, pp. 371-435. ISBN 978-0-470-01360-1

2006

Bankras, R.G. and Tiggelman, M.P.J. and Negara, M.A. and Sasse, G.T. and Schmitz, J. (2006) C-V Test Structures for Metal Gate CMOS. In: Proceedings of the International Conference on Microelectronic Test Structures (ICMTS), 6-9 Mar 2006, Austin, Texas. pp. 226-229. Electron Devices Society. IEEE. ISBN 1-4244-0167-4
Herfst, R.W. and Huizing, H.G.A. and Steeneken, P.G. and Schmitz, J. (2006) Characterization of dielectric charging in RF MEMS capacitive switches. In: Proceedings of the 2006 International Conference on Microelectronic Test Structures (ICMTS), 6-9 Mar 2006, Austin, TX, USA. pp. 133-136. IEEE. ISBN 1-4244-0167-4
Stavitski, N. and van Dal, M.J.H. and Klootwijk, J.H. and Wolters, R.A.M. and Kovalgin, A.Y. and Schmitz, J. (2006) Cross-Bridge Kelvin Resistor (CBKR) structures for silicide-semiconductor junctions characterization. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands. pp. 436-438. Technology Foundation STW. ISBN 978-90-73461-44-4
Stavitski, N. and van Dal, M.J.H. and Wolters, R.A.M. and Kovalgin, A.Y. and Schmitz, J. (2006) Specific Contact Resistance Measurements of Metal Semiconductor-Junctions. In: Proceedings of the IEEE International Conference on Microelectronic Test Structures (ICMTS), 6-9 Mar 2006, Austin, TX, USA. pp. 13-17. IEEE. ISBN 1-4244-0167-4

2005

Aarnink, A.A.I. and Boogaard, A. and Brunets, I. and Isai, I.G. and Kovalgin, A.Y. and Holleman, J. and Wolters, R.A.M. and Schmitz, J. (2005) A high-density inductively-coupled remote plasma system for the deposition of dielectrics and semiconductors. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005), 17-18 November 2005, Veldhoven, the Netherlands. pp. 67-69. Technology Foundation STW. ISBN 90-73461-50-2
Bankras, R.G. and Holleman, J. and Schmitz, J. (2005) In-Situ RHEED analysis of atomic layer deposition. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005), 17-18 November 2005, Veldhoven, The Netherlands. pp. 70-75. Technology Foundation STW. ISBN 90-73461-50-2
Brunets, I. and Boogaard, A. and Isai, I.G. and Aarnink, A.A.I. and Kovalgin, A.Y. and Holleman, J. and Schmitz, J. (2005) Three-dimensional IC's prolong the life of Moore's law. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005), 17-18 November 2005, Veldhoven, the Netherlands. pp. 76-78. Technology Foundation STW. ISBN 90-73461-50-2
Chefdeville, M.A. and Colas, P. and Giomataris, Y. and van der Graaf, H. and Heijne, E.H.M. and van der Putten, S. and Salm, C. and Schmitz, J. and Smits, S.M. and Timmermans, J. and Visschers, J.L. (2005) An electron-multiplying 'Micromegas' grid made in silicon wafer post-processing technology. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005), 17-18 November 2005, Veldhoven, The Netherlands. pp. 139-142. Technology Foundation STW. ISBN 90-73461-50-2
Herfst, R.W. and Huizing, H.G.A. and Steeneken, P.G. and Schmitz, J. (2005) Characterization of dielectric charging in RF MEMS. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005), 17-18 November 2005, Veldhoven, The Netherlands. pp. 11-14. Technology Foundation STW. ISBN 90-73461-50-2