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2005
van der Wel, A.P. and Klumperink, E.A.M. and Hoekstra, E. and Nauta, B.
(2005)
Relating Random Telegraph Signal Noise in Metal Oxide Semiconductor Transistors to Interface Trap Energy Distribution.
Applied Physics Letters, 87 (18).
183507.
ISSN 0003-6951
*** ISI Impact 3,820 ***
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