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Classification: CAES-TDT: Testable Design and Test
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2016

Alt, J. and Bernardi, P. and Bosio, A. and Cantoro, R. and Kerkhoff, H.G. and Leininger, A and Molzer, W. and Motta, A. and Pacha, C. and Pagani, A and Rohani, A. and Strasser, S. (2016) Thermal issues in test: An overview of the significant aspects and industrial practice. (Invited) In: IEEE 34th VLSI Test Symposium (VTS 2016), 25-27 Apr 2016, Las Vegas, NV, USA. pp. 1-4. IEEE. ISBN 978-1-4673-8454-4
Ebrahimi, H. and Kerkhoff, H.G. (2016) Testing for intermittent resistive faults in CMOS integrated systems. In: IEEE 2016 Euromicro Conference on Digital System Design (DSD) , 31 Aug - 02 Sep 2016, Limassol, Cyprus. pp. 703-707. IEEE Circuits & Systems Society. ISBN 978-1-5090-2817-7
Ebrahimi, H. and Kerkhoff, H.G. (2016) Detecting intermittent resistive faults in digital CMOS circuits. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 19-20 Sep 2016, Storrs, CT, USA. pp. 87-90. IEEE Computer Society. ISBN 978-1-5090-3623-3
Zambrano Constantini, A.C. and Kerkhoff, H.G. (2016) Online digital compensation method for AMR sensors. In: IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, 26-28 Sept 2016, Tallinn, Estonia. IEEE . ISBN 978-1-5090-3561-8

2015

Cantoro, R. and Sonza Reorda, M. and Rohani, A. and Kerkhoff, H.G. (2015) On the maximization of the sustained switching activity in a processor. (Invited) In: IEEE 21st International On-Line Testing Symposium, IOLST 2015, 6-8 July 2015, Halkidiki, Greece. pp. 34-35. IEEE Computer Society. ISSN 1942-9398 ISBN 978-1-4673-7905-2
Kerkhoff, H.G. and Ebrahimi, H. (2015) Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard. In: 6th Asia Symposium on Quality Electronic Design, ASQED 2015, 6-7 Aug 2015, Kuala Lumpur, Malaysia. pp. 77-82. IEEE Circuits & Systems Society. ISBN 978-1-4673-7495-8
Kerkhoff, H.G. and Ebrahimi, H. (2015) Intermittent resistive faults in digital cmos circuits. In: IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2015, 22-24 April 2015, Belgrade, Serbia. pp. 211-216. IEEE Circuits & Systems Society. ISBN 978-1-4799-6779-7
Wan, Jinbo and Kerkhoff, H.G. (2015) Embedded instruments for enhancing dependability of analogue and mixed-signal IPs. In: NIEEE 13th International New Circuits and Systems Conference, NEWCAS 2015, 7-10 June 2015, Grenoble, France. pp. 1-4. IEEE Circuits & Systems Society. ISBN 978-1-4799-8893-8
Wan, Jinbo and Kerkhoff, H.G. (2015) Reliability of SAR ADCs and associated embedded instrument detection. In: 20th International Mixed-Signal Testing Workshop, IMSTW 2015, 24-26 June 2015, Paris, France. pp. 1-5. IEEE Computer Society. ISBN 978-1-4673-6732-5
Wan, Jinbo and Kerkhoff, H.G. (2015) New drain current model for nano-meter MOS transistors on-chip threshold voltage test. In: 20th IEEE European Test Symposium, ETS 2015, 25-29 May 2015, Cluj-Napoca, Romania. pp. 1-6. IEEE Computer Society. ISBN 978-1-4799-7603-4
Zambrano Constantini, A.C. and Kerkhoff, H.G. (2015) Online digital offset voltage compensation method for AMR sensors. In: IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015, 11-14 May 2015, Pisa, Italy. pp. 1512-1515. IEEE Instrumentation & Measurement Society. ISBN 978-1-4799-6113-9

2014

Kerkhoff, H.G. and Wan, Jinbo and Zhao, Yong (2014) Linking aging measurements of health-monitors and specifications for multi-processor SoCs. In: IEEE International Conference On Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 06-08 May 2014, Santorini, Greece. pp. 1-6. IEEE Computer Society. ISBN 978-1-4799-4972-4
Khan, M.A. (2014) On improving dependability of analog and mixed-signal SoCs: A system-level approach. PhD thesis, University of Twente. CTIT Ph.D.-thesis series No. 14-328 ISBN 978-90-365-3777-3
Khan, M.A. and Kerkhoff, H.G. (2014) Studying DAC capacitor-array degradation in charge-redistribution SAR ADCs. In: 17th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, 23-25 April 2014, Warsaw, Poland. pp. 15-20. IEEE . ISBN 978-1-4799-4558-0
Sheng, Xiaoqin (2014) ADC testing using digital stimuli. PhD thesis, Univ. of Twente. CTIT Ph.D.-thesis series No. 14-343 ISBN 978-90-365-3607-3
Wan, Jinbo and Kerkhoff, H.G. (2014) The influence of no fault found in analogue CMOS circuits. In: 2014 International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW'14), 17-19 Sep 2014, Porto Alegre, Brazil. pp. 1-6. IEEE Computer Society. ISBN 978-1-47996-540-3
Wan, Jinbo and Kerkhoff, H.G. (2014) An embedded offset and gain instrument for OpAmp IPs. In: Design, Automation and Test in Europe Conference and Exhibition, DATE 2014, 24-28 Mar 2014, Dresden, Germany. pp. 1-4. Electronic Design Automation Publishing Association. ISBN 978-3-9815370-2-4
Zhang, Xiao (2014) Towards a dependable homogeneous many-processor system-on-chip. PhD thesis, Univ. of Twente . CTIT Ph.D.-thesis series No. 15-356 ISBN 978-90-365-3772-8

2013

Khan, M.A. and Kerkhoff, H.G. (2013) Monitoring operating temperature and supply voltage in achieving high system dependability. In: 8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 Mar 2013, Abu Dhabi, UAE. pp. 108-112. IEEE. ISBN 978-1-4673-6039-5
Khan, M.A. and Kerkhoff, H.G. (2013) An indirect technique for estimating reliability of analog and mixed-signal systems during operational life. In: 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, 8-10 April 2013, Karlovy Vary, Czech Republic. pp. 159-164. IEEE . ISBN 978-1-4673-6135-4
Khan, M.A. and Kerkhoff, H.G. (2013) The essence of reliability estimation during operational life for achieving high system dependability. In: 16th IEEE International Euromicro Conference on Digital System Design, DSD 2013, 4-6 Sep 2013, Santander, Spain. pp. 575-581. IEEE . ISBN 978-0-7695-5074-9
Khan, M.A. and Kerkhoff, H.G. (2013) Analysing degradation effects in charge-redistribution SAR ADCs. In: 26th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, 2-4 Oct 2013, New York, USA. pp. 65-70. IEEE . ISSN 1550-5774 ISBN 978-1-4799-1583-5
Krishnan, S. and Kerkhoff, H.G. (2013) Exploiting multiple mahalanobis distance metric to screen outliers from analogue product manufacturing test responses. IEEE design and test of computers, 30 (3). pp. 18-24. ISSN 0740-7475 ISBN 978-1-4577-0711-7
Rohani, A. and Kerkhoff, H.G. (2013) Rapid Transient Fault Insertion in Large Digital Systems. Microprocessors and microsystems, 37 (2). pp. 147-154. ISSN 0141-9331 *** ISI Impact 0,471 ***
Rohani, A. and Kerkhoff, H.G. (2013) Functional unit for a processor. Patent EP13191370.9 (Application).

2012

Kerkhoff, H.G. and Wan, Jinbo and Zhao, Yong (2012) Hierarchical modeling of automotive sensor front-ends for structural diagnosis of aging faults. In: 18th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2012, 14-16 May 2012, Taipei, Taiwan, China. pp. 91-96. IEEE Computer Society. ISBN 978-1-4673-1925-6
Sheng, Xiaoqin and Kerkhoff, H.G. and Zjajo, A. and Gronthoud, G. (2012) ADC multi-site test based on a pre-test with digital input stimulus. Journal of Electronic Testing: Theory and Applications, 28 (4). pp. 393-404. ISSN 0923-8174 ISBN 978-1-4577-0711-7 *** ISI Impact 0,361 ***
Wan, Jinbo and Kerkhoff, H.G. (2012) Monitoring active filters under automotive aging scenarios with embedded instrument. In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, 12-16 Mar 2012, Dresden, Germany. pp. 1096-1101. Electronic Design Automation Publishing Association. ISSN 1530-1591 ISBN 978-1-4577-2145-8

2011

Kerkhoff, H.G. (2011) New View Requirements for Analogue/MS IPs for Dependability Optimization in Heterogeneous SoC Design. In: 17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011, 16-18 May 2011, Santa Barbara, USA. pp. 5-11. IEEE Computer Society. ISBN 978-0-7695-4479-3
Kerzerho, V.A. and Kerkhoff, H.G. and Bollen, G-J and Xing, Y (2011) The Search for Resilience Weak Spots in Automotive Mixed-Signal Circuits. In: Proceedings 17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011, 16-18 May 2011, Santa Barbara, USA. pp. 12-18. IEEE Computer Society. ISSN 0168-275X ISBN 978-0-7695-4479-3
Khan, M.A. and Kerkhoff, H.G. (2011) A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. In: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011, 13-15 April 2011, Cottbus, Germany. pp. 17-22. IEEE . ISBN 978-1-4244-9753-9
Khan, M.A. and Kerkhoff, H.G. (2011) SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life. In: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 3-5 Oct 2011, Vancouver, B.C. Canada. pp. 374-381. IEEE Computer Society. ISSN 1550-5774 ISBN 978-0-7695-4556-1
Krishnan, S. and Kerkhoff, H.G. (2011) A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. In: Proceedings 16th IEEE European Test Symposium, ETS 2011, 23 May - 27 May 2011, Trondheim, Norway. pp. 159-164. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4577-0483-3
Wan, Jinbo and Kerkhoff, H.G. (2011) Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs. In: 2011 International SoC Design Conference, ISOCC 2011, 17-18 Nov 2011, Jeju, Korea. pp. 294-297. IEEE Circuits & Systems Society. ISBN 978-1-4577-0711-7

2010

Kerkhoff, H.G. and Wan, Jinbo (2010) Dependable Digitally-Assisted Mixed-Signal IPs Based on Integrated Self-Test & Self-Calibration. In: IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2010), 7-9 June 2010, La Grande Motte, France. pp. 1-6. IEEE Computer Society. ISBN 978-1-4244-7792-0
Krishnan, S. and Kerkhoff, H.G. (2010) Multivariate Model for Test Response Analysis. In: 15th IEEE European Test Symposium (ETS 2010), 24-28 May 2010 , Praha, Czech republic. pp. 250-251. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4244-5834-9
Krishnan, S. and Kerkhoff, H.G. and Doornbosch, K.D. and Brand, R. (2010) BlockLevel Bayesian Diagnosis of Analogue Electronic Circuits. In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, 8-12 Mar 2010, Dresden, Germany. pp. 1767-1772. IEEE. ISSN 1530-1591 ISBN 978-1-4244-7054-9
Zhang, Xiao and Kerkhoff, H.G. and Vermeulen, B. (2010) New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism. In: 15th IEEE European Test Symposium (ETS 2010), 24-28 May 2010, Praha, Czech Republic. pp. 243-244. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4244-5834-9

2009

Kerkhoff, H.G. (2009) Dependable reconfigurable multi-sensor poles for security. In: 15th International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW 2009), 10-12 Jun 2009, Scottsdale, AZ, USA. pp. 1-6. IEEE Computer Society. ISBN 978-1-4244-4618-6