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Classification: CAES-TDT: Testable Design and Test
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2011

Kerkhoff, H.G. (2011) New View Requirements for Analogue/MS IPs for Dependability Optimization in Heterogeneous SoC Design. In: 17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011, 16-18 May 2011, Santa Barbara, USA. pp. 5-11. IEEE Computer Society. ISBN 978-0-7695-4479-3
Kerzerho, V.A. and Kerkhoff, H.G. and Bollen, G-J and Xing, Y (2011) The Search for Resilience Weak Spots in Automotive Mixed-Signal Circuits. In: Proceedings 17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011, 16-18 May 2011, Santa Barbara, USA. pp. 12-18. IEEE Computer Society. ISSN 0168-275X ISBN 978-0-7695-4479-3
Khan, M.A. and Kerkhoff, H.G. (2011) A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. In: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011, 13-15 April 2011, Cottbus, Germany. pp. 17-22. IEEE . ISBN 978-1-4244-9753-9
Khan, M.A. and Kerkhoff, H.G. (2011) SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life. In: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 3-5 Oct 2011, Vancouver, B.C. Canada. pp. 374-381. IEEE Computer Society. ISSN 1550-5774 ISBN 978-0-7695-4556-1
Krishnan, S. and Kerkhoff, H.G. (2011) A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. In: Proceedings 16th IEEE European Test Symposium, ETS 2011, 23 May - 27 May 2011, Trondheim, Norway. pp. 159-164. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4577-0483-3
Wan, Jinbo and Kerkhoff, H.G. (2011) Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs. In: 2011 International SoC Design Conference, ISOCC 2011, 17-18 Nov 2011, Jeju, Korea. pp. 294-297. IEEE Circuits & Systems Society. ISBN 978-1-4577-0711-7

2010

Kerkhoff, H.G. and Wan, Jinbo (2010) Dependable Digitally-Assisted Mixed-Signal IPs Based on Integrated Self-Test & Self-Calibration. In: IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2010), 7-9 June 2010, La Grande Motte, France. pp. 1-6. IEEE Computer Society. ISBN 978-1-4244-7792-0
Krishnan, S. and Kerkhoff, H.G. (2010) Multivariate Model for Test Response Analysis. In: 15th IEEE European Test Symposium (ETS 2010), 24-28 May 2010 , Praha, Czech republic. pp. 250-251. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4244-5834-9
Krishnan, S. and Kerkhoff, H.G. and Doornbosch, K.D. and Brand , R. (2010) BlockLevel Bayesian Diagnosis of Analogue Electronic Circuits. In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, 8-12 Mar 2010, Dresden, Germany. pp. 1767-1772. IEEE. ISSN 1530-1591 ISBN 978-1-4244-7054-9
Zhang, Xiao and Kerkhoff, H.G. and Vermeulen, B. (2010) New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism. In: 15th IEEE European Test Symposium (ETS 2010), 24-28 May 2010, Praha, Czech Republic. pp. 243-244. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4244-5834-9

2009

Kerkhoff, H.G. (2009) Dependable reconfigurable multi-sensor poles for security. In: 15th International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW 2009), 10-12 Jun 2009, Scottsdale, AZ, USA. pp. 1-6. IEEE Computer Society. ISBN 978-1-4244-4618-6