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2004
Tao, G. and Scarpa, A. and van Marwijk, L. and van Dijk, K. and Kuper, F.G.
(2004)
Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes.
Microelectronics reliability, 44 (8).
pp. 1269-1273.
ISSN 0026-2714
*** ISI Impact 1,066 ***
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