EEMCS

Tiemeijer, L.F. and Havens, R.J. and de Kort, R. and Scholten, A.J. and van Langevelde, R. and Klaassen, D.B.M. and Sasse, G.T. and Bouttement, Y. and Petot, C. and Bardy, S. and Gloria, D. and Scheer, P. and Boret, S. and van Haaren, B. and Clement, C. and Larchanche, J-F. and Lim, I-S. and Duvallet, A. and Zlotnicka, A. (2005) Record RF performance of standard 90 nm CMOS technology. In: IEEE International Electron Devices Meeting 2004, 13-15 December 2004, San Francisco, California, USA. pp. 441-444. IEEE Computer Society. ISBN 0780386841