EEMCS

Sowariraj, M.S.B. and de Jong, P.C. and Salm, C. and Mouthaan, A.J. and Kuper, F.G. (2005) A 3-D circuit model to evaluate CDM performance of Ics. Microelectronics Reliability, 45 (9-11). pp. 1425-1429. ISSN 0026-2714 *** ISI Impact 1,066 ***

Sowariraj, M.S.B. and de Jong, P.C. and Salm, C. and Smedes, T. and Mouthaan, A.J. and Kuper, F.G. (2005) Significance of including substrate capacitance in the full chip circuit model of ICs under CDM stress. In: 43rd Annual IEEE International Reliability Physics Symposium, 2005, 17-21 April 2005, San Jose, California, USA. pp. 608-609. IEEE Computer Society. ISBN 0780388038

Annema, A.-J. and Geelen, G.J.G.M. and de Jong, P.C. (2001) 5.5-V I/O in a 2.5-V 0.25-µm CMOS technology. IEEE Journal of Solid-State Circuits, 36 (3). pp. 528-538. ISSN 0018-9200 *** ISI Impact 3,127 ***