EEMCS

Kelkboom, E.J.C. and de Groot, K.T.J. and Chen, Chun and Breebaart, J. and Veldhuis, R.N.J. (2009) Pitfall of the Detection Rate Optimized Bit Allocation within template protection and a remedy. In: IEEE 3rd International Conference on Biometrics: Theory, Applications, and Systems, 2009. BTAS '09., 28-30 Sep 2009, Washington, DC, USA. pp. 1-8. IEEE Computer Society. ISBN 978-1-4244-5019-0