EEMCS

Akça, B.I. and Nguyen, V. Duc and Kalkman, J. and van Leeuwen, T.G. and Wörhoff, K. and de Ridder, R.M. and Pollnau, M. (2011) Toward Miniaturized Optical Coherence Tomography. In: The Sense of Contact 13, April 7, 2011, Zeist, the Netherlands. FHI Federatie Van Technologiebranches. ISBN not assigned

Akça, B.I. and Nguyen, V. Duc and Kalkman, J. and van Leeuwen, T.G. and Wörhoff, K. and de Ridder, R.M. and Pollnau, M. (2011) Toward miniaturized optical coherence tomography. In: Conference on Lasers and Electro-Optics, CLEO, 1-6 May 2011, Baltimore, Maryland, USA. CWB3. Optical Society of America. ISBN 978-1-55752-910-7

Akça, B.I. and Nguyen, V. Duc and Kalkman, J. and van Leeuwen, T.G. and Wörhoff, K. and de Ridder, R.M. and Pollnau, M. (2011) Integrated spectrometers for spectral-domain optical coherence tomography. In: Conference on Lasers and Electro-Optics, CLEO/Europe, 22-26 May 2011, Munich, Germany. Paper CL/EB5.4. IEEE Photonics Society. ISBN 978-1-4577-0532-8

Akça, B.I. and Nguyen, V. Duc and Kalkman, J. and van Leeuwen, T.G. and Wörhoff, K. and de Ridder, R.M. and Pollnau, M. (2011) Towards spectral-domain optical coherence tomography on a silicon chip. In: International Quantum Electronics Conference and Conference on Lasers and Electro-Optics Pacific Rim, 28 August - 1 September 2011, Sydney, Australia. Paper 4430-CT. Conference Handbook. Australian Optical Society. ISBN 978-0-9775657-7-1

Akça, B.I. and Wörhoff, K. and Nguyen, V. Duc and Kalkman, J. and van Leeuwen, T.G. and de Ridder, R.M. and Pollnau, M. (2011) Towards spectral-domain optical coherence tomography on a silicon chip. In: International Laser Physics Workshop, 11-15 July 2011, Sarajevo, Bosnia and Herzegovina. Paper 3.1.3. L'Phys'11 Program. General Physics Institute, Moscow. ISBN not assigned

Nguyen, V. Duc and Akça, B.I. and Wörhoff, K. and de Ridder, R.M. and Pollnau, M. and van Leeuwen, T.G. and Kalkman, J. (2011) Spectral domain optical coherence tomography imaging with an integrated optics spectrometer. Optics letters, 36 (7). pp. 1293-1295. ISSN 0146-9592 *** ISI Impact 3,316 ***

Nguyen, V. Duc and Akça, B.I. and Worhoff, K. and de Ridder, R.M. and Pollnau, M. and van Leeuwen, T.G. and Kalkman, J. (2011) Spectral-domain optical coherence tomography with an arrayed waveguide grating spectrometer. In: European Conferences on Biomedical Optics, 22-26 May 2011, Munich, Germany. ECBO Technical Programme (paper 8091-25). Optical Society of America. ISBN not assigned

Akça, B.I. and Ismail, N. and Sun, Fei and Driessen, A. and Wörhoff, K. and Pollnau, M. and de Ridder, R.M. and Nguyen, V. Duc and Kalkman, J. and van Leeuwen, T.G. (2010) Integrated AWG spectrometer for on-chip optical coherence tomography and Raman spectroscopy. In: 15th European Conference on Integrated Optics (ECIO), 7-9 April 2010, Cambridge, United Kingdom. WeB1. IEEE Photonics Society. ISBN not assigned

Akça, B.I. and Ismail, N. and Sun, Fei and Nguyen, V. Duc and Kalkman, J. and van Leeuwen, T.G. and Driessen, A. and Wörhoff, K. and Pollnau, M. and de Ridder, R.M. (2010) Integrated arrayed waveguide grating spectrometer for on-chip optical coherence tomography. In: Conference on Lasers and Electro-Optics, 16-21 May 2010, San Jose, CA. JWA66. Optical Society of America. ISBN 978-1-55752-889-6

Nguyen, V. Duc and van Leeuwen, T.G. and Kalkman, J. and Ismail, N. and Sun, Fei and Akça, B.I. and Driessen, A. and Pollnau, M. and de Ridder, R.M. and Wörhoff, K. (2010) SiON integrated optics elliptic couplers for Fizeau-based Optical Coherence Tomography. In: 15th European Conference on Integrated Optics (ECIO 2010), 7-9 April 2010, Cambridge, United Kingdom. ThP23. IEEE Photonics Society. ISBN not assigned

Nguyen, V. Duc and Kalkman, J. and Ismail, N. and Sun, Fei and Wörhoff, K. and Driessen, A. and Pollnau, M. and van Leeuwen, T.G. (2009) Design and characterization of SiON integrated optics components for optical coherence tomography. In: Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on, 14-19 June 2009, Munich, Germany. CL.P.14 THU. IEEE. ISBN 978-1-4244-4079-5