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2006
Bankras, R.G. and Tiggelman, M.P.J. and Negara, M.A. and Sasse, G.T. and Schmitz, J.
(2006)
C-V Test Structures for Metal Gate CMOS.
In: Proceedings of the International Conference on Microelectronic Test Structures (ICMTS), 6-9 Mar 2006, Austin, Texas.
pp. 226-229.
Electron Devices Society.
IEEE.
ISBN 1-4244-0167-4
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