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2007
Piccolo, G. and Sarubbi, F. and Vandamme, L.J.K. and Macucci, M. and Scholtes, T.L.M. and Nanver, L.K.
(2007)
Low-Frequency Noise Characterization of Ultra-shallow Gate N-channel Junction Field Effect Transistors.
In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands.
pp. 448-451.
Technology Foundation STW.
ISBN 978-90-73461-49-9
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