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Author: Mouthaan, A.J.
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2009

Mouthaan, A.J. and van der Vegt, J.J.W. (2009) Self-Evaluation Applied Mathematics 2003-2008 University of Twente. Scientific Report Number UNSPECIFIED, Faculty of Electrical Engineering, Mathematics and Computer Science, University of Twente, Enschede.

2007

Mouthaan, A.J. and Hartel, P.H. (2007) Interim research assessment 2003-2005 - Computer Science. Scientific Report 2007, Faculty of Electrical Engineering, Mathematics and Computer science, University of Twente, Enschede.

2006

Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2006) Current Degradation of a-Si:H/SiN TFTs at Room Temperature and Low Voltages. IEEE Transactions on Electron Devices, 53 (9). pp. 2273-2279. ISSN 0018-9383 *** ISI Impact 2,255 ***
Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2006) Determination of the contribution of defect creation and charge trapping to the degradation of a-Si:H/SiN TFTs at room temperature and low voltages. Journal of Non-Crystalline Solids, 352 (36-37). pp. 3849-3853. ISSN 0022-3093 *** ISI Impact 1,483 ***

2005

Sowariraj, M.S.B. and de Jong, P.C. and Salm, C. and Mouthaan, A.J. and Kuper, F.G. (2005) A 3-D circuit model to evaluate CDM performance of Ics. Microelectronics Reliability, 45 (9-11). pp. 1425-1429. ISSN 0026-2714 *** ISI Impact 1,066 ***
Sowariraj, M.S.B. and de Jong, P.C. and Salm, C. and Smedes, T. and Mouthaan, A.J. and Kuper, F.G. (2005) Significance of including substrate capacitance in the full chip circuit model of ICs under CDM stress. In: 43rd Annual IEEE International Reliability Physics Symposium, 2005, 17-21 April 2005, San Jose, California, USA. pp. 608-609. IEEE Computer Society. ISBN 0780388038

2004

Nguyen, Van Hieu and Salm, C. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2004) Fast thermal cycling-enhanced electromigration in power metallization. IEEE Transactions on Device and Materials Reliability, 4 (2). pp. 246-255. ISSN 1530-4388 *** ISI Impact 1,483 ***
Nguyen, Van Hieu and Salm, C. and Krabbenborg, B.H. and Weide-Zaage, K. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2004) Effect of thermal gradients on the electromigration lifetime in power electronics. In: IEEE 42nd Annual International Reliability Physics Symposium, 25-29 Apr 2004, Phoenix, Arizona, USA. pp. 619-620. IEEE Computer Society. ISSN 1082-7285 ISBN 078038315X

2003

Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2003) Progressive degradation in a-Si: H/SiN thin film transistors. Thin Solid Films, 427 (1-2). 60-66. ISSN 0040-6090 *** ISI Impact 1,909 ***
Nguyen, Van Hieu and Salm, C. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2003) Electrothermomigration-induced failure in power IC metallization. In: Proceedings of the 6th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2003, 25-26 November 2003, Veldhoven, The Netherlands. pp. 622-630. Technology Foundation STW. ISBN 90-73461-39-1
Nguyen, Van Hieu and Salm, C. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2003) A reliability model for interlayer dielectric cracking during fast thermal cycling. In: Advanced Metallization Conference (AMC 2003), 21-23 Oct 2003, Montreal, Canada. pp. 295-299. Materials Research Society. ISBN 1558997571
Sowariraj, M.S.B. and Smedes, T. and Salm, C. and Mouthaan, A.J. and Kuper, F.G. (2003) Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels - An explantion and die protection strategy. Microelectronics Reliability, 43 (9-11). pp. 1569-1575. ISSN 0026-2714 *** ISI Impact 1,066 ***
Sowariraj, M.S.B. and Smedes, T. and Salm, C. and Mouthaan, A.J. and Kuper, F.G. (2003) Study on the influence of package parasitics and substrate resistance on the Charged Device Model(CDM) failure levels - possible protection methodology. In: Proceedings of the 6th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2003, 25 - 26 November 2003, Veldhoven, The Netherlands. pp. 657-662. Technology Foundation STW. ISBN 90-73461-39-1

2002

Golo-Tosic, N. and Jenneboer, A.J.S.M. and Mouthaan, A.J. (2002) Dealing with electrostatic discharge in a capacitive fingerprint sensor fabricated in amorphous silicon thin film technology. In: Proceedings of Semiconductor Sensor and Actuator Technology SeSens 2002, 29 Nov 2002, Veldhoven, The Netherlands. pp. 616-621. Technology Foundation STW. ISBN 90-73461-33-2
Golo-Tosic, N. and Kuper, F.G. and Mouthaan, A.J. (2002) Analysis of the electrical breakdown in hydrogenated amorphous silicon thin-film transistors. IEEE transactions on electron devices, 49 (6). pp. 1012-1018. ISSN 0018-9383 *** ISI Impact 2,255 ***
Golo-Tosic, N. and Kuper, F.G. and Mouthaan, A.J. (2002) Zapping thin film transistors. Microelectronics Reliability, 42 (4). pp. 747-765. ISSN 0026-2714 *** ISI Impact 1,066 ***
Golo-Tosic, N. and van der Wal, S. and Kuper, F.G. and Mouthaan, A.J. (2002) Estimation of the impact of electrostatic discharge on density of states in hydrogenated amorphous silicon thin-film transistors. Applied Physics Letters, 80 (18). pp. 3337-3339. ISSN 0003-6951 *** ISI Impact 3,820 ***
Nguyen, Van Hieu and Salm, C. and Vroemen, J. and Voets, J. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2002) Fast temperature cycling and electromigration induced thin film cracking multilevel interconnection: experiments and modeling. Microelectronics Reliability, 42 (9-11). pp. 1415-1420. ISSN 0026-2714 *** ISI Impact 1,066 ***
Nguyen, Van Hieu and Salm, C. and Vroemen, J. and Voets, J. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2002) Fast temperature cycling stress-induced and electromigration-induced interlayer dielectric cracking failure in multilevel interconnection. In: Proceedings of the 5th annual workshop on Semiconductors Advances for Future Electronics SAFE 2002, 27-28 November 2002, Veldhoven, The Netherlands. pp. 69-74. Technology Foundation STW. ISBN 90-73461-33-2
Nguyen, Van Hieu and Salm, C. and Vroemen, J. and Voets, J. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2002) Test chip for detecting thin film cracking induced by fast temperature cycling and electromigration in multilevel interconnect systems. In: 9th International Symposium on Physics and Failure Analysis 2002, 8-12 Jul 2002, Singapore, Thailand. pp. 135-139. IEEE Computer Society. ISBN 0780374169
Nguyen, Van Hieu and Salm, C. and Wenzel, R. and Mouthaan, A.J. and Kuper, F.G. (2002) Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime. Microelectronics Reliability, 42 (9-11). pp. 1421-1425. ISSN 0026-2714 *** ISI Impact 1,066 ***
Sowariraj, M.S.B. and Kuper, F.G. and Salm, C. and Mouthaan, A.J. and Smedes, T. (2002) Impact of layout and technology variation on the CDM performance of ggNMOSTs and SCRs. In: Proceedings of the 5th annual workshop on Semiconductors Advances for Future Electronics SAFE 2002, 27-28 November 2002, Veldhoven, The Netherlands. pp. 104-107. Technology Foundation STW. ISBN 90-73461-33-2
Sowariraj, M.S.B. and Salm, C. and Mouthaan, A.J. and Smedes, T. and Kuper, F.G. (2002) The influence of technology variation on ggNMOSTs and SCRs against CDM ESD stress. Microelectronics Reliability, 42 (9-11). pp. 1287-1292. ISSN 0026-2714 *** ISI Impact 1,066 ***

2001

Golo-Tosic, N. and van der Wal, S. and Kuper, F.G. and Mouthaan, A.J. (2001) The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin film transistors. Microelectronics Reliability, 41 (9-10). pp. 1391-1396. ISSN 0026-2714 *** ISI Impact 1,066 ***
Merticaru, A.R. and Mouthaan, A.J. (2001) Dynamics of metastable defects in a-Si:H/SiN TFTs. Thin solid Films, 383 (1-2). pp. 122-124. ISSN 0040-6090 *** ISI Impact 1,909 ***
Merticaru, A.R. and Mouthaan, A.J. and Kuper, F.G. (2001) Study of dynamics of charge trapping in a-Si:H/SiN TFTs. In: Proceedings of the 4th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2001, 29-30 Nov 2001, Veldhoven, The Netherlands. pp. 109-114. Technology Foundation STW. ISBN 90-73461-29-4
Nguyen, Van Hieu and Salm, C. and Mouthaan, A.J. and Kuper, F.G. (2001) Modeling of the reservoir effect on electromigration lifetime. In: 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits, 9-13 Jul 2001, Singapore, Thailand. pp. 169-173. IEEE Computer Society. ISBN 0-7803-6675-1
Nguyen, Van Hieu and Salm, C. and Vroemen, J. and Voets, J. and Krabbenborg, B.H. and Bisschop, J. and Mouthaan, A.J. and Kuper, F.G. (2001) Fast thermal cycling stress and degredation in multilayer interconnects. In: Proceedings of 4th Annual Workshop on Semiconductors Advances for Future Electronics SAFE 2001, 28-30 Nov 2001, Veldhoven, The Netherlands. pp. 136-140. Technology Foundation STW. ISBN 90-73461-29-4

1992

van Mullem, C.J. and Tilmans, H.A.C. and Mouthaan, A.J. and Fluitman, J.H.J. (1992) Electrical cross-talk in two-port resonators - the resonant silicon beam force sensor. Sensors and actuators A: Physical, 31 (1-3 pt 3). pp. 168-173. ISSN 0924-4247 *** ISI Impact 1,933 ***

1991

Van Eijk, P.D. and Reglat, M. and Vassilieff, G. and Krijnen, G.J.M. and Driessen, A. and Mouthaan, A.J. (1991) Analysis of the modal behavior of an antiguide diode laser array with Talbot filter. Journal of lightwave technology, 9 (5). pp. 629-634. ISSN 0733-8724 *** ISI Impact 2,255 ***