EEMCS

Scholten, A.J. and Smit, G.D.J. and Pijper, R.M.T. and Tiemijer, L.F. and Tuinhout, H.P. and van der Steen, J-L.P.J. and Mercha, A. and Braccioli, M. and Klaassen, D.B.M. (2009) Experimental assessment of self-heating in SOI FinFETs. In: Proceedings of the 2009 International Electron Device Meeting, 5-11 Dec 2009, Baltimore, USA. pp. 305-308. IEEE Computer Society. ISBN 978-1-4244-5640-6