EEMCS

De Korte, P.A.J. and Hoevers, H.F.C. and Den Herder, J.W.A. and Bleeker, J.A.M. and Bergmann Tiest, W.M. and Bruijn, M.P. and Ridder, M.L. and Wiegerink, R.J. and Kaastra, J.S. and Van der Kuur, J. and Mels, W.A. (2002) A TES X-ray microcalorimeter-array for imaging spectroscopy. In: Proceedings of SPIE - The International Society for Optical Engineering, 24-28 Aug 2002, Waikoloa, HI, United States. pp. 779-789. The International Society for Optical Engineering. ISSN 0277-786X

Moktadir, Z. and Bruijn, M.P. and Wiegerink, R.J. and Elwenspoek, M.C. and Ridder, M.L. and Mels, W.A. (2002) Limitations of Heat Conductivity in Cryogenic Sensors Due to Surface Roughness. In: Proceedings of IEEE Sensors, 12 - 14 June 2002, Orlando, Florida. pp. 1024-1027. IEEE Computer Society. ISBN 0-7803-7454-1