EEMCS

Ruhrig, M. and Porthun, S. and Lodder, J.C. and McVitie, S. and Heyderman, L.J. and Johnston, A.B. and Chapman, J.N. (1996) Electron beam fabrication and characterization of high- resolution magnetic force microscopy tips. Journal of applied physics, 79. pp. 2913-2919. ISSN 0021-8979 *** ISI Impact 2,064 ***

te Lintelo, J.G.T. and Lodder, J.C. and McVitie, S. and Chapman, J.N. (1994) Magnetic stray fields of Co-Cr microstrips measured by Lorentz microscopy. Journal of applied physics, 75. pp. 3002-3007. ISSN 0021-8979 *** ISI Impact 2,064 ***