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2007
Hurley, P.K. and Cherkaoui, K. and McDonnell, S. and Hughes, G. and Groenland, A.W.
(2007)
Characterisation and passivation of interface defects in (1 0 0)/Si/SiO2/HfO2/TiN gate stacks
Microelectronics reliability, 47 (2007) (8).
pp. 1195-1201.
ISSN 0026-2714
*** ISI Impact 1,066 ***
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