EEMCS EPrints Service
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2010
Luo, Y. and Lai, X. and Gong, Zheng
(2010)
Pseudorandomness analysis of the (extended) Lai–Massey scheme.
Information processing letters, 111 (2).
pp. 90-96.
ISSN 0020-0190
*** ISI Impact 0,612 ***
2008
Kahn, A. and Gün, T. and Ileri, B. and Kühn, H. and Petermann, K. and Huber, G. and Bradley, J.D.B. and Ay, F. and Wörhoff, K. and Pollnau, M. and Luo, Y. and Hoffmann, P.
(2008)
Mono-crystalline rare earth doped (Gd,Lu)2O3 waveguiding films produced by pulsed laser deposition and structured by reactive ion etching
In: Proceedings Conference on Lasers and Electro-Optics, CLEO 2008, 4-9 May 2008, San Jose, California, U.S.A..
Paper CTuS1.
Optical Society of America.
ISBN 978-1-55752-859-9
Kahn, A. and Kühn, H. and Heinrich, S. and Gün, T. and Tellkamp, F. and Petermann, K. and Bradley, J.D.B. and Ay, F. and Wörhoff, K. and Pollnau, M. and Kuzminykh, Y. and Luo, Y. and Hoffmann, P. and Huber, G.
(2008)
In-band pumping of expitaxially grown Er:(Gd,Lu)2O3 waveguides for active integrated optical devices
In: 3rd EPS-QEOD: Europhoton Conference on Solid-State and Fiber coherent Light sources, 31-8-2008 - 5-9-2008, Paris, France.
Paper THoD.2.
European Physical Society.
ISBN 2-914771-55-X
2007
Luo, Y. and Gardillou, F. and Borca, C.N. and Coric, D. and Romanyuk, Y.E. and Pollnau, M. and Hoffmann, P. and Salathé, R.P.
(2007)
Measurement of propagation loss in rare-earth-ion-doped potassium yttrium double tungstate (KYW) waveguides by optical low coherence reflectometry.
In: Proceedings of the European Materials Research Society Meeting 2007, Symposium C: Rare Earth ion doping for photonics: Materials, mechanisms and devices., 28 May - 1 June 2007, Strasbourg, France.
European Materials Research Society (EMRS).
ISBN not assigned
2001
Bal, K. and Kirilyuk, A. and Rasing, T. and Luo, Y. and Samwer, K. and Haast, M.A.M. and Lodder, J.C.
(2001)
CoNi/Pt interface roughness probed by nonlinear magneto-optics, x-ray scattering and atomic force microscopy.
Journal of applied physics, 89.
pp. 4670-4672.
ISSN 0021-8979
*** ISI Impact 2,064 ***
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