EEMCS

Klee, M. and Keur, W. and Mauczock, R. and van Esch, H. and de Wild, M. and Liu, J. and Roest, A.L. and Reimann, K. and Renders, C. and Peters, L. and Tiggelman, M.P.J. and Wunnicke, O. and Neumann, K. (2008) MI004 miniaturised, high performance ferroelectric and piezoelectric thin film devices. In: 17th IEEE International Symposium on the Applications of Ferroelectrics, 2008. ISAF 2008, 23-28 feb 2008, Santa Re, NM, USA. pp. 1-4. IEEE Computer Society. ISSN 1099-4734 ISBN 978-1-4244-2744-4

Tiggelman, M.P.J. and Reimann, K. and Liu, J. and Klee, M. and Keur, W. and Mauczock, R. and Schmitz, J. and Hueting, R.J.E. (2008) Identifying dielectric and resistive electrode losses in high-density capacitors at radio frequencies. In: Proceedings of the 21st ICMTS 2008 IEEE Conference on Microelectronic Test Structures, 24-27 Mar 2008, Edinburgh, Schotland. pp. 190-195. IEEE Computer Society. ISBN 978-1-4244-1801-5

Tiggelman, M.P.J. and Reimann, K. and Liu, J. and Klee, M. and Mauczock, R. and Keur, W. and Schmitz, J. and Hueting, R.J.E. (2008) The trade-off between tuning ratio and quality factor of Ba_xSr_1-xTiO₃ MIM capacitors on alumina substrates In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands. pp. 506-508. Technology Foundation STW. ISBN 978-90-73461-56-7

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Schmitz, J. and Hueting, R.J.E. and Liu, J. and Furukawa, Y. and Mauczock, R. and Keur, W. (2007) Separation of intrinsic dielectric and resistive electrode losses in ferroelectric capacitors at radio frequencies. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands. pp. 465-467. Technology Foundation STW. ISBN 978-90-73461-49-9