EEMCS EPrints Service
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2006
de Jong, B.R. and Brouwer, D.M. and Jansen, H.V. and de Boer, M.J. and Lammertink, T.G. and Stramigioli, S. and Krijnen, G.J.M.
(2006)
A planar 3 dof sample manipulator for nano-scale characterization.
In: 19th IEEE International Conference on Micro Electro Mechanical Systems, 2006, May 2006, Istanbul.
pp. 750-753.
IEEE Computer Society.
ISSN 0018-9219
ISBN 0-7803-9475-5
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