EEMCS

Kerkhoff, H.G. and Kuiken, O.J. and Zhang, Xiao (2008) Increasing SoC Dependability via Known Good Tile NoC Testing. In: FastAbs Track of The 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN2008), 24-27 June 2009, Anchorage, Alaska. Paper 14. Unpublished. ISBN not assigned

Kuiken, O.J. and Zhang, Xiao and Kerkhoff, H.G. (2008) Built-in self-diagnostics for a NoC-based reconfigurable IC for dependable beamforming applications. In: The 23rd IEEE International symposium on defect and fault-tolerance in VLSI systems DFT 2008, 1-3 Oct 2008, Cambridge, MA, USA. pp. 45-53. IEEE Computer Society. ISSN 1550-5774 ISBN 978-0-7695-3365-0