EEMCS

Krishnan, S. and Kerkhoff, H.G. (2011) A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. In: Proceedings 16th IEEE European Test Symposium, ETS 2011, 23 May - 27 May 2011, Trondheim, Norway. pp. 159-164. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4577-0483-3

Krishnan, S. and Kerkhoff, H.G. (2010) Multivariate Model for Test Response Analysis. In: 15th IEEE European Test Symposium (ETS 2010), 24-28 May 2010 , Praha, Czech republic. pp. 250-251. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4244-5834-9

Krishnan, S. and Kerkhoff, H.G. and Doornbosch, K.D. and Brand , R. (2010) BlockLevel Bayesian Diagnosis of Analogue Electronic Circuits. In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, 8-12 Mar 2010, Dresden, Germany. pp. 1767-1772. IEEE. ISSN 1530-1591 ISBN 978-1-4244-7054-9