EEMCS

Hoekstra, H.J.W.M. and Lambeck, P.V. and Uranus, H.P. and Koster, T.M. (2008) Relation between noise and resolution in integrated optical refractometric sensing. Sensors and actuators B: Chemical, 134 (2). pp. 702-710. ISSN 0925-4005 *** ISI Impact 3,368 ***

Hoekstra, H.J.W.M. and Lambeck, P.V. and Koster, T.M. and Uranus, H.P. (2007) Noise and resolution in IO interferometric sensing. In: Proceedings European Conference on Integrated Optics (ECIO), 27-28 April 2007, Copenhagen, Denmark. WH5. Technical University of Denmark. ISBN not assigned

Gui, C. and Veldhuis, G.J. and Koster, T.M. and Lambeck, P.V. and Berenschot, J.W. and Gardeniers, J.G.E. and Elwenspoek, M.C. (1999) Fabrication of nanomechanical optical devices with aligned wafer bonding. Microsystem technologies, 5 (3). pp. 138-143. ISSN 0946-7076 *** ISI Impact 1,069 ***

Gui, C. and Veldhuis, G.J. and Koster, T.M. and Lambeck, P.V. and Berenschot, J.W. and Gardeniers, J.G.E. and Elwenspoek, M.C. (1998) Nanomechanical optical devices fabricated with aligned wafer bonding. In: The Eleventh Annual International Workshop on Micro Electro Mechanical Systems, MEMS 98 Proceedings, 25-29 Jan 1998, Heidelberg. pp. 482-487. IEEE Computer Society. ISSN 1084-6999 ISBN 0-7803-4412-X

Veldhuis, G.J. and Gui, C. and Nauta, T. and Koster, T.M. and Berenschot, J.W. and Lambeck, P.V. and Gardeniers, J.G.E. and Elwenspoek, M.C. (1998) Mechano-optical waveguide on-off intensity modulator. Optics Letters, 23 (19). pp. 1532-1534. ISSN 0146-9592 *** ISI Impact 3,316 ***