EEMCS

Kolhatkar, J.S. and Salm, C. and Knitel, M.J. and Wallinga, H. (2005) Constant and switched bias low frequency noise in p-MOSFETs with varying gate oxide thickness. In: Proceedings of the 32nd European Solid-State Device Research Conference, 24-26 September 2002, University of Bologna, Italia. pp. 83-86. IEEE Computer Society. ISBN 88-900847-8-2