EEMCS

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Mauczock, R. and Keur, W. and Hueting, R.J.E. (2010) Ba_xSr_1-xTi_1.02O₃ metal-insulator-metal capacitors on planarized alumina substrates Thin solid films, 518 (10). pp. 2854-2959. ISSN 0040-6090 *** ISI Impact 1,909 ***

Klee, M. and van Esch, H. and Keur, W. and Kumar, B. and van Leuken-Peters, L. and Liu, Jin and Mauczock, R. and Neumann, K. and Reimann, K. and Renders, C. and Roest, A.L. and Tiggelman, M.P.J. and de Wild, M. and Wunnicke, O. and Zhao, J. (2009) Ferroelectric Thin-Film Capacitors and Piezoelectric Switches for Mobile Communication Applications. IEEE transactions on ultrasonics, ferroelectrics and frequency control, 56 (8). pp. 1505-1512. ISSN 0885-3010 *** ISI Impact 1,460 ***

Klee, M. and Keur, W. and Mauczock, R. and van Esch, H. and de Wild, M. and Liu, J. and Roest, A.L. and Reimann, K. and Renders, C. and Peters, L. and Tiggelman, M.P.J. and Wunnicke, O. and Neumann, K. (2008) MI004 miniaturised, high performance ferroelectric and piezoelectric thin film devices. In: 17th IEEE International Symposium on the Applications of Ferroelectrics, 2008. ISAF 2008, 23-28 feb 2008, Santa Re, NM, USA. pp. 1-4. IEEE Computer Society. ISSN 1099-4734 ISBN 978-1-4244-2744-4

Tiggelman, M.P.J. and Reimann, K. and Liu, J. and Klee, M. and Keur, W. and Mauczock, R. and Schmitz, J. and Hueting, R.J.E. (2008) Identifying dielectric and resistive electrode losses in high-density capacitors at radio frequencies. In: Proceedings of the 21st ICMTS 2008 IEEE Conference on Microelectronic Test Structures, 24-27 Mar 2008, Edinburgh, Schotland. pp. 190-195. IEEE Computer Society. ISBN 978-1-4244-1801-5

Tiggelman, M.P.J. and Reimann, K. and Liu, J. and Klee, M. and Mauczock, R. and Keur, W. and Schmitz, J. and Hueting, R.J.E. (2008) The trade-off between tuning ratio and quality factor of Ba_xSr_1-xTiO₃ MIM capacitors on alumina substrates In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands. pp. 506-508. Technology Foundation STW. ISBN 978-90-73461-56-7

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Schmitz, J. and Hueting, R.J.E. and Liu, J. and Furukawa, Y. and Mauczock, R. and Keur, W. (2007) Separation of intrinsic dielectric and resistive electrode losses in ferroelectric capacitors at radio frequencies. In: 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE), 29-30 Nov 2007, Veldhoven, The Netherlands. pp. 465-467. Technology Foundation STW. ISBN 978-90-73461-49-9

Tiggelman, M.P.J. and Reimann, K. and Klee, M. and Beelen, D. and Keur, W. and Schmitz, J. and Hueting, R.J.E. (2006) Electrical characterization of thin film ferroelectric capacitors. In: Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006, 23-24 Nov 2006, Veldhoven, The Netherlands. pp. 439-443. Technology Foundation STW. ISBN 90-73461-44-8