EEMCS EPrints Service
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2001
Chen, X.Y. and Johansen, J.A. and Salm, C. and van Rheenen, A.D.
(2001)
On low-frequency noise of polycrystalline GexSi1-x for sub-micron CMOS technologies
Solid-State Electronics, 45 (11).
pp. 1967-1971.
ISSN 0038-1101
*** ISI Impact 1,438 ***
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