EEMCS

Herfst, R.W. and Steeneken, P.G. and Huizing, H.G.A. and Schmitz, J. (2008) Center-Shift Method for the Characterization of Dielectric Charging in RF MEMS Capacitive Switches. IEEE Transactions on Semiconductor Manufacturing, 21 (2). pp. 148-153. ISSN 0894-6507 *** ISI Impact 0,748 ***

Herfst, R.W. and Huizing, H.G.A. and Steeneken, P.G. and Schmitz, J. (2006) Characterization of dielectric charging in RF MEMS capacitive switches. In: Proceedings of the 2006 International Conference on Microelectronic Test Structures (ICMTS), 6-9 Mar 2006, Austin, TX, USA. pp. 133-136. IEEE. ISBN 1-4244-0167-4

Herfst, R.W. and Huizing, H.G.A. and Steeneken, P.G. and Schmitz, J. (2005) Characterization of dielectric charging in RF MEMS. In: 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005), 17-18 November 2005, Veldhoven, The Netherlands. pp. 11-14. Technology Foundation STW. ISBN 90-73461-50-2