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2001
Salm, C. and Houtsma, V.E. and Kuper, F.G. and Woerlee, P.H.
(2001)
Temperature acceleration of thin gate-oxide degradation.
In: Proceedings of the 4th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2001, 28-30 Nov 2001, Veldhoven, The Netherlands.
pp. 174-177.
Technology Foundation STW.
ISBN 90-73461-29-4
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