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2002
Bearda, T. and Woerlee, P.H. and Wallinga, H. and Heyns, M.M.
(2002)
Charge transport after hard breakdown in gate oxides.
Japanese Journal of Applied Physics, Special Issue: Solid State Devices & Materials Part 1, No. 4B, April 2002, 41 (4B).
pp. 2431-2436.
ISSN 0021-4922
*** ISI Impact 1,018 ***
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