EEMCS

Li, Yuan and Donnet, D. and Grzegorczyk, A. and Cavelaars, J. and Kuper, F.G. (2010) Assessing the degradation mechanisms and current limitation design rules of SICR-based thin-film resistors in integrated circuits. In: Proceedings of the IEEE International Reliability Physics Symposium 2010 (IRPS), 2-6 May 2010, Anaheim, CA, USA. pp. 724-730. IEEE Computer Society. ISBN 978-1-4244-5430-3