EEMCS

Pollnau, M. and Romanyuk, Y.E. and Gardillou, F. and Borca, C.N. and Griebner, U. and Rivier, S. and Petrov, V. (2007) Double tungstate lasers: From bulk toward on-chip integrated waveguide devices. IEEE journal of selected topics in quantum electronics, 13 (3). pp. 661-671. ISSN 1077-260X *** ISI Impact 3,458 ***

Rivier, S. and Mateos, X. and Petrov, V. and Griebner, U. and Romanyuk, Y.E. and Borca, C.N. and Gardillou, F. and Pollnau, M. (2007) KY(WO₄)₂:Tm³⁺ planar waveguide laser In: Technical Digest Conference on Lasers and Electro-Optics, CLEO 2007, 06-11 May 2007, Baltimore, Maryland, U.S.A.. CTuII6. Optical Society of America. ISBN 1-55752-834-9

Rivier, S. and Mateos, X. and Petrov, V. and Griebner, U. and Romanyuk, Y.E. and Borca, C.N. and Gardillou, F. and Pollnau, M. (2007) Tm:KY(WO₄)₂ waveguide laser Optics express, 15 (9). pp. 5885-5892. ISSN 1094-4087 *** ISI Impact 3,749 ***

Romanyuk, Y.E. and Borca, C.N. and Pollnau, M. and Rivier, S. and Petrov, V. and Griebner, U. (2006) Yb-doped KY(WO₄)₂ planar waveguide laser Optics letters, 31 (1). pp. 53-55. ISSN 0146-9592 *** ISI Impact 3,316 ***

Romanyuk, Y.E. and Borca, C.N. and Pollnau, M. and Griebner, U. and Rivier, S. and Petrov, V. (2005) KY(WO₄)₂:Yb³⁺ planar waveguide laser In: Technical Digest of the Conference on Lasers and Electro-Optics, CLEO 2005, 22-27 May 2005, Baltimore, Maryland, U.S.A.. Paper CThI5. Optical Society of America. ISBN 1-55752-7709

Romanyuk, Y.E. and Borca, C.N. and Pollnau, M. and Rivier, S. and Petrov, V. and Griebner, U. (2005) High slope efficiency in epitaxially grown KY(WO₄)₂:Yb³⁺ (Invited) In: Book of Abstracts of the 14th annual International Laser Physics Workshop, 4-8 July 2005, Kyoto, Japan. 243. Organization of the 14th International Laser Physics Workshop. ISBN not assigned

Romanyuk, Y.E. and Borca, C.N. and Pollnau, M. and Rivier, S. and Petrov, V. and Griebner, U. (2005) Surface and buried planar waveguide lasers based on KY(WO₄)₂:Yb³⁺ In: Conference Digest Conference on Lasers and Electro-Optics Europe, 12-17 June 2008, Munich, Germany. 539. IEEE Operations Center. ISBN 0-7803-8974-3