EEMCS

Golo-Tosic, N. (2002) Electrostatic discharge effects in thin film transistors. PhD thesis, University of Twente. ISBN 9036518091

Golo-Tosic, N. and Jenneboer, A.J.S.M. and Mouthaan, A.J. (2002) Dealing with electrostatic discharge in a capacitive fingerprint sensor fabricated in amorphous silicon thin film technology. In: Proceedings of Semiconductor Sensor and Actuator Technology SeSens 2002, 29 Nov 2002, Veldhoven, The Netherlands. pp. 616-621. Technology Foundation STW. ISBN 90-73461-33-2

Golo-Tosic, N. and Kuper, F.G. and Mouthaan, A.J. (2002) Analysis of the electrical breakdown in hydrogenated amorphous silicon thin-film transistors. IEEE transactions on electron devices, 49 (6). pp. 1012-1018. ISSN 0018-9383 *** ISI Impact 2,255 ***

Golo-Tosic, N. and Kuper, F.G. and Mouthaan, A.J. (2002) Zapping thin film transistors. Microelectronics Reliability, 42 (4). pp. 747-765. ISSN 0026-2714 *** ISI Impact 1,066 ***

Golo-Tosic, N. and van der Wal, S. and Kuper, F.G. and Mouthaan, A.J. (2002) Estimation of the impact of electrostatic discharge on density of states in hydrogenated amorphous silicon thin-film transistors. Applied Physics Letters, 80 (18). pp. 3337-3339. ISSN 0003-6951 *** ISI Impact 3,820 ***

Golo-Tosic, N. and van der Wal, S. and Kuper, F.G. and Mouthaan, A.J. (2001) The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin film transistors. Microelectronics Reliability, 41 (9-10). pp. 1391-1396. ISSN 0026-2714 *** ISI Impact 1,066 ***