EEMCS

Feijs, L.M.G. and Goga, N. and Mauw, S. and Tretmans, G.J. (2002) Test Selection, Trace Distance and Heuristics. In: Testing of Communicating Systems XIV, Applications to Internet Technologies and Services, Proceedings of the IFIP 14th International Conference on Testing Communicating Systems - TestCom, March 19-22, 2002, Berlin, Germany. pp. 267-282. IFIP Conference Proceedings 210. Kluwer Academic Publishers. ISBN 0-7923-7695-1

de Vries, R.G. and Tretmans, G.J. and Belinfante, A.F.E. and Feenstra, J. and Feijs, L.M.G. and Mauw, S. and Goga, N. and Heerink, A.W. and de Heer, A. (2000) Côte de Resyste in Progress. In: 1st PROGRESS workshop on Embedded Systems, 13 October 2000, Utrecht. pp. 141-148. Technology Foundation STW. ISBN 90-73461-25-1

Belinfante, A.F.E. and Feenstra, J. and de Vries, R.G. and Tretmans, G.J. and Goga, N. and Feijs, L.M.G. and Mauw, S. and Heerink, A.W. (1999) Formal Test Automation: A Simple Experiment. In: Proceedings of the IFIP TC6 12th International Workshop on Testing Communicating Systems: Method and Applications. pp. 179-196. IFIP Conference Proceedings 147. Kluwer Academic Publishers. ISBN 0-7923-8581-0